Yaguchi T - Search Results

1

Observation of human dentine by focused ion beam and energy-filtering transmission electron microscopy.

Hoshi K, Ejiri S, Probst W, Seybold V, Kamino T, Yaguchi T, Yamahira N, Ozawa H. Hoshi K, et al. Among authors: yaguchi t. J Microsc. 2001 Jan;201(Pt 1):44-9. doi: 10.1046/j.1365-2818.2001.00784.x. J Microsc. 2001. PMID: 11136438

2

Cross-sectional sample preparation by focused ion beam: a review of ion-sample interaction.

Ishitani T, Yaguchi T. Ishitani T, et al. Among authors: yaguchi t. Microsc Res Tech. 1996 Nov 1;35(4):320-33. doi: 10.1002/(SICI)1097-0029(19961101)35:4<320::AID-JEMT3>3.0.CO;2-Q. Microsc Res Tech. 1996. PMID: 8987026 Review.

3

High-resolution electron microscopy of human enamel sections prepared with focused ion beam system.

Hayashi Y, Yaguchi T, Ito K, Kamino T. Hayashi Y, et al. Among authors: yaguchi t. Scanning. 1998 Apr;20(3):234-5. Scanning. 1998. PMID: 9604395 No abstract available.

4

Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a Dedicated Focused Ion Beam System.

Yaguchi T, Kamino T, Ishitani T, Urao R. Yaguchi T, et al. Microsc Microanal. 1999 Sep;5(5):365-370. doi: 10.1017/s1431927699000203. Microsc Microanal. 1999. PMID: 10473682

5

Cross-sectional Specimen Preparation and Observation of a Plasma Sprayed Coating Using a Focused Ion Beam/Transmission Electron Microscopy System.

Yaguchi T, Kamino T, Sasaki M, Barbezat G, Urao R. Yaguchi T, et al. Microsc Microanal. 2000 May;6(3):218-223. Microsc Microanal. 2000. PMID: 10790490

6

A method for characterizing carbon nanotubes.

Yaguchi T, Sato T, Kamino T, Taniguchi Y, Motomiya K, Tohji K, Kasuya A. Yaguchi T, et al. J Electron Microsc (Tokyo). 2001;50(4):321-4. doi: 10.1093/jmicro/50.4.321. J Electron Microsc (Tokyo). 2001. PMID: 11592677

7

Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel.

Yaguchi T, Matsumoto H, Kamino T, Ishitani T, Urao R. Yaguchi T, et al. Microsc Microanal. 2001 May;7(3):287-291. Microsc Microanal. 2001. PMID: 12597819

8

Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction.

Ishitani T, Umemura K, Ohnishi T, Yaguchi T, Kamino T. Ishitani T, et al. Among authors: yaguchi t. J Electron Microsc (Tokyo). 2004;53(5):443-9. doi: 10.1093/jmicro/dfh078. J Electron Microsc (Tokyo). 2004. PMID: 15582945

9

Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV.

Kamino T, Yaguchi T, Kuroda Y, Ohnishi T, Ishitani T, Miyahara Y, Horita Z. Kamino T, et al. Among authors: yaguchi t. J Electron Microsc (Tokyo). 2004;53(5):459-63. doi: 10.1093/jmicro/dfh058. J Electron Microsc (Tokyo). 2004. PMID: 15582947

10

Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell.

Kamino T, Yaguchi T, Ohnishi T, Ishitani T, Osumi M. Kamino T, et al. Among authors: yaguchi t. J Electron Microsc (Tokyo). 2004;53(5):563-6. doi: 10.1093/jmicro/dfh063. J Electron Microsc (Tokyo). 2004. PMID: 15582966

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