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Local plasticity of Al thin films as revealed by x-ray microdiffraction.
Spolenak R, Brown WL, Tamura N, MacDowell AA, Celestre RS, Padmore HA, Valek B, Bravman JC, Marieb T, Fujimoto H, Batterman BW, Patel JR. Spolenak R, et al. Phys Rev Lett. 2003 Mar 7;90(9):096102. doi: 10.1103/PhysRevLett.90.096102. Epub 2003 Mar 4. Phys Rev Lett. 2003. PMID: 12689241
Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges.
Etzelstorfer T, Süess MJ, Schiefler GL, Jacques VL, Carbone D, Chrastina D, Isella G, Spolenak R, Stangl J, Sigg H, Diaz A. Etzelstorfer T, et al. Among authors: spolenak r. J Synchrotron Radiat. 2014 Jan;21(Pt 1):111-8. doi: 10.1107/S1600577513025459. Epub 2013 Nov 2. J Synchrotron Radiat. 2014. PMID: 24365924 Free PMC article.
Power-dependent Raman analysis of highly strained Si nanobridges.
Süess MJ, Minamisawa RA, Geiger R, Bourdelle KK, Sigg H, Spolenak R. Süess MJ, et al. Among authors: spolenak r. Nano Lett. 2014 Mar 12;14(3):1249-54. doi: 10.1021/nl404152r. Epub 2014 Feb 28. Nano Lett. 2014. PMID: 24564181
Dealloying of platinum-aluminum thin films: dynamics of pattern formation.
Galinski H, Ryll T, Schlagenhauf L, Rechberger F, Ying S, Gauckler LJ, Mornaghini FC, Ries Y, Spolenak R, Döbeli M. Galinski H, et al. Among authors: spolenak r. Phys Rev Lett. 2011 Nov 25;107(22):225503. doi: 10.1103/PhysRevLett.107.225503. Epub 2011 Nov 21. Phys Rev Lett. 2011. PMID: 22182033
50 results