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Local plasticity of Al thin films as revealed by x-ray microdiffraction.
Phys Rev Lett. 2003 Mar 7;90(9):096102. doi: 10.1103/PhysRevLett.90.096102. Epub 2003 Mar 4.
Phys Rev Lett. 2003.
PMID: 12689241
Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.
Tamura N, MacDowell AA, Spolenak R, Valek BC, Bravman JC, Brown WL, Celestre RS, Padmore HA, Batterman BW, Patel JR.
Tamura N, et al. Among authors: valek bc.
J Synchrotron Radiat. 2003 Mar 1;10(Pt 2):137-43. doi: 10.1107/s0909049502021362. Epub 2003 Feb 27.
J Synchrotron Radiat. 2003.
PMID: 12606791
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