Zandbergen HW - Search Results

1

High resolution EELS using monochromator and high performance spectrometer: comparison of V2O5 ELNES with NEXAFS and band structure calculations.

Su DS, Zandbergen HW, Tiemeijer PC, Kothleitner G, Hävecker M, Hébert C, Knop-Gericke A, Freitag BH, Hofer F, Schlögl R. Su DS, et al. Among authors: zandbergen hw. Micron. 2003;34(3-5):235-8. doi: 10.1016/s0968-4328(03)00033-7. Micron. 2003. PMID: 12895495

2

Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution.

Mitterbauer C, Kothleitner G, Grogger W, Zandbergen H, Freitag B, Tiemeijer P, Hofer F. Mitterbauer C, et al. Ultramicroscopy. 2003 Sep;96(3-4):469-80. doi: 10.1016/S0304-3991(03)00109-8. Ultramicroscopy. 2003. PMID: 12871809

3

Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theory.

Lazar S, Hébert C, Zandbergen HW. Lazar S, et al. Among authors: zandbergen hw. Ultramicroscopy. 2004 Jan;98(2-4):249-57. doi: 10.1016/j.ultramic.2003.08.018. Ultramicroscopy. 2004. PMID: 15046805

4

Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope.

Lazar S, Botton GA, Zandbergen HW. Lazar S, et al. Among authors: zandbergen hw. Ultramicroscopy. 2006 Oct-Nov;106(11-12):1091-103. doi: 10.1016/j.ultramic.2006.04.024. Epub 2006 Jul 5. Ultramicroscopy. 2006. PMID: 16872750

5

Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy.

Lazar S, Botton GA, Wu MY, Tichelaar FD, Zandbergen HW. Lazar S, et al. Among authors: zandbergen hw. Ultramicroscopy. 2003 Sep;96(3-4):535-46. doi: 10.1016/S0304-3991(03)00114-1. Ultramicroscopy. 2003. PMID: 12871814

6

Atomic imaging in aberration-corrected high-resolution transmission electron microscopy.

Chen JH, Zandbergen HW, Dyck DV. Chen JH, et al. Among authors: zandbergen hw. Ultramicroscopy. 2004 Jan;98(2-4):81-97. doi: 10.1016/j.ultramic.2003.08.003. Ultramicroscopy. 2004. PMID: 15046789

7

Angular and local spectroscopic analysis to probe the vertical alignment of N-doped well-separated carbon nanotubes.

Minea TM, Bouchet-Fabre B, Lazar S, Point S, Zandbergen HW. Minea TM, et al. Among authors: zandbergen hw. J Phys Chem B. 2006 Aug 17;110(32):15659-62. doi: 10.1021/jp0637072. J Phys Chem B. 2006. PMID: 16898707

8

Determination of absolute configurations of crystal structures using electron diffraction patterns by means of least-squares refinement.

Jansen J, Zandbergen HW. Jansen J, et al. Among authors: zandbergen hw. Ultramicroscopy. 2002 Apr;90(4):291-300. doi: 10.1016/s0304-3991(01)00136-x. Ultramicroscopy. 2002. PMID: 11942647

9

Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis.

Jansen J, Otten MT, Zandbergen HW. Jansen J, et al. Among authors: zandbergen hw. Ultramicroscopy. 2013 Feb;125:59-65. doi: 10.1016/j.ultramic.2012.09.010. Epub 2012 Nov 5. Ultramicroscopy. 2013. PMID: 23274686

10

The effect of inelastic scattering on crystal structure refinement from electron diffraction patterns recorded under almost parallel illumination.

Jansen J, Zandbergen HW, Otten MT. Jansen J, et al. Among authors: zandbergen hw. Ultramicroscopy. 2004 Jan;98(2-4):165-72. doi: 10.1016/j.ultramic.2003.08.010. Ultramicroscopy. 2004. PMID: 15046796

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