Van Dyck D - Search Results

1

How to optimize the experimental design of quantitative atomic resolution TEM experiments?

Van Aert S, den Dekker AJ, Van Dyck D. Van Aert S, et al. Among authors: van dyck d. Micron. 2004;35(6):425-9. doi: 10.1016/j.micron.2004.01.007. Micron. 2004. PMID: 15120126

2

High-resolution electron microscopy and electron tomography: resolution versus precision.

Van Aert S, den Dekker AJ, Van Dyck D, van den Bos A. Van Aert S, et al. Among authors: van dyck d, van den bos a. J Struct Biol. 2002 Apr-May;138(1-2):21-33. doi: 10.1016/s1047-8477(02)00016-3. J Struct Biol. 2002. PMID: 12160698

3

Physical limits on atomic resolution.

Van Dyck D, Van Aert S, den Dekker AJ. Van Dyck D, et al. Among authors: van aert s. Microsc Microanal. 2004 Feb;10(1):153-7. doi: 10.1017/S143192760404036X. Microsc Microanal. 2004. PMID: 15306080 Free article. Review.

4

Advanced electron crystallography through model-based imaging.

Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. IUCrJ. 2016 Jan 1;3(Pt 1):71-83. doi: 10.1107/S2052252515019727. eCollection 2016 Jan 1. IUCrJ. 2016. PMID: 26870383 Free PMC article. Review.

5

Optimal experimental design of STEM measurement of atom column positions.

Van Aert S, den Dekker AJ, Van Dyck D, van den Bos A. Van Aert S, et al. Among authors: van dyck d, van den bos a. Ultramicroscopy. 2002 Apr;90(4):273-89. doi: 10.1016/s0304-3991(01)00152-8. Ultramicroscopy. 2002. PMID: 11942646

6

Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?

Van Dyck D, Van Aert S, den Dekker AJ, van den Bos A. Van Dyck D, et al. Among authors: van den bos a, van aert s. Ultramicroscopy. 2003 Dec;98(1):27-42. doi: 10.1016/S0304-3991(03)00023-8. Ultramicroscopy. 2003. PMID: 14609640

7

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.

Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D, Chen JH. Van Aert S, et al. Among authors: van dyck d, van den bos a. Ultramicroscopy. 2005 Sep;104(2):107-25. doi: 10.1016/j.ultramic.2005.03.002. Epub 2005 Apr 7. Ultramicroscopy. 2005. PMID: 15982521

8

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

9

A model based atomic resolution tomographic algorithm.

Van den Broek W, Van Aert S, Van Dyck D. Van den Broek W, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2009 Nov;109(12):1485-90. doi: 10.1016/j.ultramic.2009.08.003. Epub 2009 Aug 27. Ultramicroscopy. 2009. PMID: 19765902

10

Linear versus non-linear structural information limit in high-resolution transmission electron microscopy.

Van Aert S, Chen JH, Van Dyck D. Van Aert S, et al. Among authors: van dyck d. Ultramicroscopy. 2010 Oct;110(11):1404-10. doi: 10.1016/j.ultramic.2010.07.001. Epub 2010 Jul 14. Ultramicroscopy. 2010. PMID: 20655146

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