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Real-time monitoring of growing nanoparticles.
Renaud G, Lazzari R, Revenant C, Barbier A, Noblet M, Ulrich O, Leroy F, Jupille J, Borensztein Y, Henry CR, Deville JP, Scheurer F, Mane-Mane J, Fruchart O. Renaud G, et al. Science. 2003 May 30;300(5624):1416-9. doi: 10.1126/science.1082146. Science. 2003. PMID: 12775836
Atomic structure of the polar NiO(111)- p(2x2) surface.
Barbier A, Mocuta C, Kuhlenbeck H, Peters KF, Richter B, Renaud G. Barbier A, et al. Among authors: renaud g. Phys Rev Lett. 2000 Mar 27;84(13):2897-900. doi: 10.1103/PhysRevLett.84.2897. Phys Rev Lett. 2000. PMID: 11018970
Strains induced by point defects in graphene on a metal.
Blanc N, Jean F, Krasheninnikov AV, Renaud G, Coraux J. Blanc N, et al. Among authors: renaud g. Phys Rev Lett. 2013 Aug 23;111(8):085501. doi: 10.1103/PhysRevLett.111.085501. Epub 2013 Aug 20. Phys Rev Lett. 2013. PMID: 24010451 Free article.
The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV-CVD and MBE reactor for in situ X-ray scattering investigations of growing nanoparticles and semiconductor nanowires.
Cantelli V, Geaymond O, Ulrich O, Zhou T, Blanc N, Renaud G. Cantelli V, et al. Among authors: renaud g. J Synchrotron Radiat. 2015 May;22(3):688-700. doi: 10.1107/S1600577515001605. Epub 2015 Apr 9. J Synchrotron Radiat. 2015. PMID: 25931085
177 results