Bals S - Search Results

1

Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range.

Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D. Bals S, et al. Phys Rev Lett. 2006 Mar 10;96(9):096106. doi: 10.1103/PhysRevLett.96.096106. Epub 2006 Mar 10. Phys Rev Lett. 2006. PMID: 16606285

2

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: bals s. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

3

Electronically coupled complementary interfaces between perovskite band insulators.

Huijben M, Rijnders G, Blank DH, Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Brinkman A, Hilgenkamp H. Huijben M, et al. Among authors: bals s. Nat Mater. 2006 Jul;5(7):556-60. doi: 10.1038/nmat1675. Epub 2006 Jun 18. Nat Mater. 2006. PMID: 16783359

4

Crystallographic shear structures as a route to anion-deficient perovskites.

Abakumov AM, Hadermann J, Bals S, Nikolaev IV, Antipov EV, Van Tendeloo G. Abakumov AM, et al. Among authors: bals s. Angew Chem Int Ed Engl. 2006 Oct 13;45(40):6697-700. doi: 10.1002/anie.200602480. Angew Chem Int Ed Engl. 2006. PMID: 16969885 No abstract available.

5

Evaluation of top, angle, and side cleaned FIB samples for TEM analysis.

Montoya E, Bals S, Rossell MD, Schryvers D, Van Tendeloo G. Montoya E, et al. Among authors: bals s. Microsc Res Tech. 2007 Dec;70(12):1060-71. doi: 10.1002/jemt.20514. Microsc Res Tech. 2007. PMID: 17722055

6

Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAlO3/SrTiO3 multilayers prepared by focused ion beam.

Montoya E, Bals S, Van Tendeloo G. Montoya E, et al. Among authors: bals s. J Microsc. 2008 Sep;231(3):359-63. doi: 10.1111/j.1365-2818.2008.02055.x. J Microsc. 2008. PMID: 18754990 No abstract available.

7

Effect of amorphous layers on the interpretation of restored exit waves.

Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G. Van Aert S, et al. Among authors: bals s. Ultramicroscopy. 2009 Feb;109(3):237-46. doi: 10.1016/j.ultramic.2008.10.024. Epub 2008 Nov 14. Ultramicroscopy. 2009. PMID: 19110376

8

3D imaging of nanomaterials by discrete tomography.

Batenburg KJ, Bals S, Sijbers J, Kübel C, Midgley PA, Hernandez JC, Kaiser U, Encina ER, Coronado EA, Van Tendeloo G. Batenburg KJ, et al. Among authors: bals s. Ultramicroscopy. 2009 May;109(6):730-40. doi: 10.1016/j.ultramic.2009.01.009. Epub 2009 Jan 31. Ultramicroscopy. 2009. PMID: 19269094

9

Quantitative three-dimensional modeling of zeotile through discrete electron tomography.

Bals S, Batenburg KJ, Liang D, Lebedev O, Van Tendeloo G, Aerts A, Martens JA, Kirschhock CE. Bals S, et al. J Am Chem Soc. 2009 Apr 8;131(13):4769-73. doi: 10.1021/ja8089125. J Am Chem Soc. 2009. PMID: 19290635

10

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: bals s. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

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