Sandoz P - Search Results

1

Fiber microaxicons fabricated by a polishing technique for the generation of Bessel-like beams.

Grosjean T, Saleh SS, Suarez MA, Ibrahim IA, Piquerey V, Charraut D, Sandoz P. Grosjean T, et al. Among authors: sandoz p. Appl Opt. 2007 Nov 20;46(33):8061-7. doi: 10.1364/ao.46.008061. Appl Opt. 2007. PMID: 18026544

2

3D localization of a labeled target by means of a stereo vision configuration with subvoxel resolution.

Arias H NA, Sandoz P, Meneses JE, Suarez MA, Gharbi T. Arias H NA, et al. Among authors: sandoz p. Opt Express. 2010 Nov 8;18(23):24152-62. doi: 10.1364/OE.18.024152. Opt Express. 2010. PMID: 21164761 Free article.

3

Nanometric position and displacement measurement of the six degrees of freedom by means of a patterned surface element.

Sandoz P. Sandoz P. Appl Opt. 2005 Mar 10;44(8):1449-53. doi: 10.1364/ao.44.001449. Appl Opt. 2005. PMID: 15799113

4

High-accuracy position and orientation measurement of extended two-dimensional surfaces by a phase-sensitive vision method.

Sandoz P, Bonnans V, Gharbi T. Sandoz P, et al. Appl Opt. 2002 Sep 10;41(26):5503-11. doi: 10.1364/ao.41.005503. Appl Opt. 2002. PMID: 12224773

5

Toward stereovisual monitoring of three-dimensional translations with submicrometer resolution.

Sandoz P, Elhechmi I, Gharbi T. Sandoz P, et al. J Opt Soc Am A Opt Image Sci Vis. 2012 Nov 1;29(11):2451-8. doi: 10.1364/JOSAA.29.002451. J Opt Soc Am A Opt Image Sci Vis. 2012. PMID: 23201809

6

Lensless vision system for in-plane positioning of a patterned plate with subpixel resolution.

Sandoz P, Jacquot M. Sandoz P, et al. J Opt Soc Am A Opt Image Sci Vis. 2011 Dec 1;28(12):2494-500. doi: 10.1364/JOSAA.28.002494. J Opt Soc Am A Opt Image Sci Vis. 2011. PMID: 22193262

7

Towards objective evaluation of the skin aspect: principles and instrumentation.

Sandoz P, Marsaut D, Armbruster V, Humbert P, Gharbi T. Sandoz P, et al. Skin Res Technol. 2004 Nov;10(4):263-70. doi: 10.1111/j.1600-0846.2004.00081.x. Skin Res Technol. 2004. PMID: 15536658

8

Position referencing in optical microscopy thanks to sample holders with out-of-focus encoded patterns.

Sandoz P, Zeggari R, Froehly L, Pretet JL, Mougin C. Sandoz P, et al. J Microsc. 2007 Mar;225(Pt 3):293-303. doi: 10.1111/j.1365-2818.2007.01745.x. J Microsc. 2007. PMID: 17371453

9

Surface profiling by means of double spectral modulation.

Calatroni JE, Sandoz P, Tribillon G. Calatroni JE, et al. Among authors: sandoz p. Appl Opt. 1993 Jan 1;32(1):30-7. doi: 10.1364/AO.32.000030. Appl Opt. 1993. PMID: 20802657

10

In-plane rigid-body vibration mode characterization with a nanometer resolution by stroboscopic imaging of a microstructured pattern.

Sandoz P, Friedt JM, Carry E. Sandoz P, et al. Rev Sci Instrum. 2007 Feb;78(2):023706. doi: 10.1063/1.2472604. Rev Sci Instrum. 2007. PMID: 17578116

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