Hÿtch M - Search Results

1

Nanoscale holographic interferometry for strain measurements in electronic devices.

Hÿtch M, Houdellier F, Hüe F, Snoeck E. Hÿtch M, et al. Nature. 2008 Jun 19;453(7198):1086-9. doi: 10.1038/nature07049. Nature. 2008. PMID: 18563161

2

Measurement of the displacement field of dislocations to 0.03 A by electron microscopy.

Hÿtch MJ, Putaux JL, Pénisson JM. Hÿtch MJ, et al. Nature. 2003 May 15;423(6937):270-3. doi: 10.1038/nature01638. Nature. 2003. PMID: 12748637

3

Off-axis electron holography of magnetic nanowires and chains, rings, and planar arrays of magnetic nanoparticles.

Dunin-Borkowski RE, Kasama T, Wei A, Tripp SL, Hÿtch MJ, Snoeck E, Harrison RJ, Putnis A. Dunin-Borkowski RE, et al. Microsc Res Tech. 2004 Aug;64(5-6):390-402. doi: 10.1002/jemt.20098. Microsc Res Tech. 2004. PMID: 15549694

4

Calibration of projector lens distortions.

Hüe F, Johnson CL, Lartigue-Korinek S, Wang G, Buseck PR, Hÿtch MJ. Hüe F, et al. Among authors: hytch mj. J Electron Microsc (Tokyo). 2005 Jun;54(3):181-90. doi: 10.1093/jmicro/dfi042. Epub 2005 Aug 25. J Electron Microsc (Tokyo). 2005. PMID: 16123065

5

Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique.

Warot-Fonrose B, Houdellier F, Hÿtch MJ, Calmels L, Serin V, Snoeck E. Warot-Fonrose B, et al. Among authors: hytch mj. Ultramicroscopy. 2008 Apr;108(5):393-8. doi: 10.1016/j.ultramic.2007.05.013. Epub 2007 Jun 12. Ultramicroscopy. 2008. PMID: 17619085

6

Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF).

Houdellier F, Hÿtch MJ. Houdellier F, et al. Among authors: hytch mj. Ultramicroscopy. 2008 Feb;108(3):285-94. doi: 10.1016/j.ultramic.2007.08.016. Epub 2007 Oct 30. Ultramicroscopy. 2008. PMID: 18061351

7

Effects of elastic anisotropy on strain distributions in decahedral gold nanoparticles.

Johnson CL, Snoeck E, Ezcurdia M, Rodríguez-González B, Pastoriza-Santos I, Liz-Marzán LM, Hÿtch MJ. Johnson CL, et al. Among authors: hytch mj. Nat Mater. 2008 Feb;7(2):120-4. doi: 10.1038/nmat2083. Epub 2007 Dec 16. Nat Mater. 2008. PMID: 18084296

8

Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy.

Hüe F, Hÿtch M, Bender H, Houdellier F, Claverie A. Hüe F, et al. Among authors: hytch m. Phys Rev Lett. 2008 Apr 18;100(15):156602. doi: 10.1103/PhysRevLett.100.156602. Epub 2008 Apr 17. Phys Rev Lett. 2008. PMID: 18518137

9

Dark-field electron holography for the measurement of geometric phase.

Hÿtch MJ, Houdellier F, Hüe F, Snoeck E. Hÿtch MJ, et al. Ultramicroscopy. 2011 Jul;111(8):1328-37. doi: 10.1016/j.ultramic.2011.04.008. Epub 2011 Apr 30. Ultramicroscopy. 2011. PMID: 21864773

10

A new linear transfer theory and characterization method for image detectors. Part II: experiment.

Lubk A, Röder F, Niermann T, Gatel C, Joulie S, Houdellier F, Magén C, Hÿtch MJ. Lubk A, et al. Ultramicroscopy. 2012 Apr;115:78-87. doi: 10.1016/j.ultramic.2012.01.011. Epub 2012 Feb 3. Ultramicroscopy. 2012. PMID: 22424716

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