Van Aert S - Search Results

1

Effect of amorphous layers on the interpretation of restored exit waves.

Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g. Ultramicroscopy. 2009 Feb;109(3):237-46. doi: 10.1016/j.ultramic.2008.10.024. Epub 2008 Nov 14. Ultramicroscopy. 2009. PMID: 19110376

2

Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?

Van Dyck D, Van Aert S, den Dekker AJ, van den Bos A. Van Dyck D, et al. Among authors: van den bos a, van aert s. Ultramicroscopy. 2003 Dec;98(1):27-42. doi: 10.1016/S0304-3991(03)00023-8. Ultramicroscopy. 2003. PMID: 14609640

3

Model based quantification of EELS spectra.

Verbeeck J, Van Aert S. Verbeeck J, et al. Among authors: van aert s. Ultramicroscopy. 2004 Nov;101(2-4):207-24. doi: 10.1016/j.ultramic.2004.06.004. Ultramicroscopy. 2004. PMID: 15450666

4

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.

Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D, Chen JH. Van Aert S, et al. Among authors: van dyck d, van den bos a. Ultramicroscopy. 2005 Sep;104(2):107-25. doi: 10.1016/j.ultramic.2005.03.002. Epub 2005 Apr 7. Ultramicroscopy. 2005. PMID: 15982521

5

Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range.

Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D. Bals S, et al. Among authors: van tendeloo g, van aert s. Phys Rev Lett. 2006 Mar 10;96(9):096106. doi: 10.1103/PhysRevLett.96.096106. Epub 2006 Mar 10. Phys Rev Lett. 2006. PMID: 16606285

6

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

7

Electronically coupled complementary interfaces between perovskite band insulators.

Huijben M, Rijnders G, Blank DH, Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Brinkman A, Hilgenkamp H. Huijben M, et al. Among authors: van tendeloo g, van aert s. Nat Mater. 2006 Jul;5(7):556-60. doi: 10.1038/nmat1675. Epub 2006 Jun 18. Nat Mater. 2006. PMID: 16783359

8

Model-based quantification of EELS spectra: Including the fine structure.

Verbeeck J, Van Aert S, Bertoni G. Verbeeck J, et al. Among authors: van aert s. Ultramicroscopy. 2006 Oct-Nov;106(11-12):976-80. doi: 10.1016/j.ultramic.2006.05.006. Epub 2006 Jun 30. Ultramicroscopy. 2006. PMID: 16843599

9

Electron channelling based crystallography.

Van Aert S, Geuens P, Van Dyck D, Kisielowski C, Jinschek JR. Van Aert S, et al. Among authors: van dyck d. Ultramicroscopy. 2007 Jun-Jul;107(6-7):551-8. doi: 10.1016/j.ultramic.2006.04.031. Epub 2006 Dec 12. Ultramicroscopy. 2007. PMID: 17197092

10

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

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