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Page 1
TEM sample preparation by FIB for carbon nanotube interconnects.
Ke X, Bals S, Romo Negreira A, Hantschel T, Bender H, Van Tendeloo G. Ke X, et al. Among authors: van tendeloo g. Ultramicroscopy. 2009 Oct;109(11):1353-9. doi: 10.1016/j.ultramic.2009.06.011. Epub 2009 Jul 10. Ultramicroscopy. 2009. PMID: 19665846
Atomic resolution mapping of phonon excitations in STEM-EELS experiments.
Egoavil R, Gauquelin N, Martinez GT, Van Aert S, Van Tendeloo G, Verbeeck J. Egoavil R, et al. Among authors: van tendeloo g, van aert s. Ultramicroscopy. 2014 Dec;147:1-7. doi: 10.1016/j.ultramic.2014.04.011. Epub 2014 May 29. Ultramicroscopy. 2014. PMID: 24949597
Advanced electron microscopy for advanced materials.
Van Tendeloo G, Bals S, Van Aert S, Verbeeck J, Van Dyck D. Van Tendeloo G, et al. Among authors: van dyck d, van aert s. Adv Mater. 2012 Nov 8;24(42):5655-75. doi: 10.1002/adma.201202107. Epub 2012 Aug 21. Adv Mater. 2012. PMID: 22907862 Review.
Advanced electron crystallography through model-based imaging.
Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. IUCrJ. 2016 Jan 1;3(Pt 1):71-83. doi: 10.1107/S2052252515019727. eCollection 2016 Jan 1. IUCrJ. 2016. PMID: 26870383 Free PMC article. Review.
Three-dimensional atomic imaging of colloidal core-shell nanocrystals.
Bals S, Casavola M, van Huis MA, Van Aert S, Batenburg KJ, Van Tendeloo G, Vanmaekelbergh D. Bals S, et al. Among authors: van tendeloo g, van huis ma, van aert s. Nano Lett. 2011 Aug 10;11(8):3420-4. doi: 10.1021/nl201826e. Epub 2011 Jul 27. Nano Lett. 2011. PMID: 21786766
256 results