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3ω correction method for eliminating resistance measurement error due to Joule heating.
Guralnik B, Hansen O, Henrichsen HH, Beltrán-Pitarch B, Østerberg FW, Shiv L, Marangoni TA, Stilling-Andersen AR, Cagliani A, Hansen MF, Nielsen PF, Oprins H, Vermeersch B, Adelmann C, Dutta S, Borup KA, Mihiretie BM, Petersen DH. Guralnik B, et al. Among authors: petersen dh. Rev Sci Instrum. 2021 Sep 1;92(9):094711. doi: 10.1063/5.0063998. Rev Sci Instrum. 2021. PMID: 34598479
A variable probe pitch micro-Hall effect method.
Witthøft ML, Østerberg FW, Bogdanowicz J, Lin R, Henrichsen HH, Hansen O, Petersen DH. Witthøft ML, et al. Among authors: petersen dh. Beilstein J Nanotechnol. 2018 Jul 20;9:2032-2039. doi: 10.3762/bjnano.9.192. eCollection 2018. Beilstein J Nanotechnol. 2018. PMID: 30116693 Free PMC article.
Graphene conductance uniformity mapping.
Buron JD, Petersen DH, Bøggild P, Cooke DG, Hilke M, Sun J, Whiteway E, Nielsen PF, Hansen O, Yurgens A, Jepsen PU. Buron JD, et al. Among authors: petersen dh. Nano Lett. 2012 Oct 10;12(10):5074-81. doi: 10.1021/nl301551a. Epub 2012 Sep 7. Nano Lett. 2012. PMID: 22947167
Electrical characterization of single nanometer-wide Si fins in dense arrays.
Folkersma S, Bogdanowicz J, Schulze A, Favia P, Petersen DH, Hansen O, Henrichsen HH, Nielsen PF, Shiv L, Vandervorst W. Folkersma S, et al. Among authors: petersen dh. Beilstein J Nanotechnol. 2018 Jun 25;9:1863-1867. doi: 10.3762/bjnano.9.178. eCollection 2018. Beilstein J Nanotechnol. 2018. PMID: 30013880 Free PMC article.
26 results