Van Dyck D - Search Results

1

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

2

Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?

Van Dyck D, Van Aert S, den Dekker AJ, van den Bos A. Van Dyck D, et al. Among authors: van den bos a, van aert s. Ultramicroscopy. 2003 Dec;98(1):27-42. doi: 10.1016/S0304-3991(03)00023-8. Ultramicroscopy. 2003. PMID: 14609640

3

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.

Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D, Chen JH. Van Aert S, et al. Among authors: van dyck d, van den bos a. Ultramicroscopy. 2005 Sep;104(2):107-25. doi: 10.1016/j.ultramic.2005.03.002. Epub 2005 Apr 7. Ultramicroscopy. 2005. PMID: 15982521

4

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

5

Experiments on inelastic electron holography.

Potapov PL, Lichte H, Verbeeck J, van Dyck D. Potapov PL, et al. Among authors: van dyck d. Ultramicroscopy. 2006 Oct-Nov;106(11-12):1012-8. doi: 10.1016/j.ultramic.2006.05.012. Epub 2006 Jul 5. Ultramicroscopy. 2006. PMID: 16934930

6

Electron channelling based crystallography.

Van Aert S, Geuens P, Van Dyck D, Kisielowski C, Jinschek JR. Van Aert S, et al. Among authors: van dyck d. Ultramicroscopy. 2007 Jun-Jul;107(6-7):551-8. doi: 10.1016/j.ultramic.2006.04.031. Epub 2006 Dec 12. Ultramicroscopy. 2007. PMID: 17197092

7

A model based atomic resolution tomographic algorithm.

Van den Broek W, Van Aert S, Van Dyck D. Van den Broek W, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2009 Nov;109(12):1485-90. doi: 10.1016/j.ultramic.2009.08.003. Epub 2009 Aug 27. Ultramicroscopy. 2009. PMID: 19765902

8

Linear versus non-linear structural information limit in high-resolution transmission electron microscopy.

Van Aert S, Chen JH, Van Dyck D. Van Aert S, et al. Among authors: van dyck d. Ultramicroscopy. 2010 Oct;110(11):1404-10. doi: 10.1016/j.ultramic.2010.07.001. Epub 2010 Jul 14. Ultramicroscopy. 2010. PMID: 20655146

9

Throughput maximization of particle radius measurements through balancing size versus current of the electron probe.

Van den Broek W, Van Aert S, Goos P, Van Dyck D. Van den Broek W, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2011 Jun;111(7):940-7. doi: 10.1016/j.ultramic.2010.11.025. Epub 2010 Nov 24. Ultramicroscopy. 2011. PMID: 21146303

10

A method to determine the local surface profile from reconstructed exit waves.

Wang A, Chen FR, Van Aert S, Van Dyck D. Wang A, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2011 Jul;111(8):1352-9. doi: 10.1016/j.ultramic.2011.04.005. Epub 2011 May 1. Ultramicroscopy. 2011. PMID: 21864776

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