An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range.
Vine DJ, Williams GJ, Clark JN, Putkunz CT, Pfeifer MA, Legnini D, Roehrig C, Wrobel E, Huwald E, van Riessen G, Abbey B, Beetz T, Irwin J, Feser M, Hornberger B, McNulty I, Nugent KA, Peele AG.
Vine DJ, et al. Among authors: beetz t.
Rev Sci Instrum. 2012 Mar;83(3):033703. doi: 10.1063/1.3688655.
Rev Sci Instrum. 2012.
PMID: 22462925