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An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy.
Howells MR, Beetz T, Chapman HN, Cui C, Holton JM, Jacobsen CJ, Kirz J, Lima E, Marchesini S, Miao H, Sayre D, Shapiro DA, Spence JC, Starodub D. Howells MR, et al. Among authors: beetz t. J Electron Spectros Relat Phenomena. 2009 Mar 1;170(1-3):4-12. doi: 10.1016/j.elspec.2008.10.008. J Electron Spectros Relat Phenomena. 2009. PMID: 20463854 Free PMC article.
High-resolution ab initio three-dimensional x-ray diffraction microscopy.
Chapman HN, Barty A, Marchesini S, Noy A, Hau-Riege SP, Cui C, Howells MR, Rosen R, He H, Spence JC, Weierstall U, Beetz T, Jacobsen C, Shapiro D. Chapman HN, et al. Among authors: beetz t. J Opt Soc Am A Opt Image Sci Vis. 2006 May;23(5):1179-200. doi: 10.1364/josaa.23.001179. J Opt Soc Am A Opt Image Sci Vis. 2006. PMID: 16642197
Biological imaging by soft x-ray diffraction microscopy.
Shapiro D, Thibault P, Beetz T, Elser V, Howells M, Jacobsen C, Kirz J, Lima E, Miao H, Neiman AM, Sayre D. Shapiro D, et al. Among authors: beetz t. Proc Natl Acad Sci U S A. 2005 Oct 25;102(43):15343-6. doi: 10.1073/pnas.0503305102. Epub 2005 Oct 11. Proc Natl Acad Sci U S A. 2005. PMID: 16219701 Free PMC article.
An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range.
Vine DJ, Williams GJ, Clark JN, Putkunz CT, Pfeifer MA, Legnini D, Roehrig C, Wrobel E, Huwald E, van Riessen G, Abbey B, Beetz T, Irwin J, Feser M, Hornberger B, McNulty I, Nugent KA, Peele AG. Vine DJ, et al. Among authors: beetz t. Rev Sci Instrum. 2012 Mar;83(3):033703. doi: 10.1063/1.3688655. Rev Sci Instrum. 2012. PMID: 22462925
11 results