Van Aert S - Search Results

1

Linear versus non-linear structural information limit in high-resolution transmission electron microscopy.

Van Aert S, Chen JH, Van Dyck D. Van Aert S, et al. Among authors: van dyck d. Ultramicroscopy. 2010 Oct;110(11):1404-10. doi: 10.1016/j.ultramic.2010.07.001. Epub 2010 Jul 14. Ultramicroscopy. 2010. PMID: 20655146

2

Does a monochromator improve the precision in quantitative HRTEM?

den Dekker AJ, Van Aert S, Van Dyck D, van den Bos A, Geuens P. den Dekker AJ, et al. Among authors: van dyck d, van den bos a, van aert s. Ultramicroscopy. 2001 Nov;89(4):275-90. doi: 10.1016/s0304-3991(01)00089-4. Ultramicroscopy. 2001. PMID: 11766983

3

Optimal experimental design of STEM measurement of atom column positions.

Van Aert S, den Dekker AJ, Van Dyck D, van den Bos A. Van Aert S, et al. Among authors: van dyck d, van den bos a. Ultramicroscopy. 2002 Apr;90(4):273-89. doi: 10.1016/s0304-3991(01)00152-8. Ultramicroscopy. 2002. PMID: 11942646

4

High-resolution electron microscopy and electron tomography: resolution versus precision.

Van Aert S, den Dekker AJ, Van Dyck D, van den Bos A. Van Aert S, et al. Among authors: van dyck d, van den bos a. J Struct Biol. 2002 Apr-May;138(1-2):21-33. doi: 10.1016/s1047-8477(02)00016-3. J Struct Biol. 2002. PMID: 12160698

5

Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?

Van Dyck D, Van Aert S, den Dekker AJ, van den Bos A. Van Dyck D, et al. Among authors: van den bos a, van aert s. Ultramicroscopy. 2003 Dec;98(1):27-42. doi: 10.1016/S0304-3991(03)00023-8. Ultramicroscopy. 2003. PMID: 14609640

6

How to optimize the experimental design of quantitative atomic resolution TEM experiments?

Van Aert S, den Dekker AJ, Van Dyck D. Van Aert S, et al. Among authors: van dyck d. Micron. 2004;35(6):425-9. doi: 10.1016/j.micron.2004.01.007. Micron. 2004. PMID: 15120126

7

Physical limits on atomic resolution.

Van Dyck D, Van Aert S, den Dekker AJ. Van Dyck D, et al. Among authors: van aert s. Microsc Microanal. 2004 Feb;10(1):153-7. doi: 10.1017/S143192760404036X. Microsc Microanal. 2004. PMID: 15306080 Free article. Review.

8

Model based quantification of EELS spectra.

Verbeeck J, Van Aert S. Verbeeck J, et al. Among authors: van aert s. Ultramicroscopy. 2004 Nov;101(2-4):207-24. doi: 10.1016/j.ultramic.2004.06.004. Ultramicroscopy. 2004. PMID: 15450666

9

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: a theoretical framework.

den Dekker AJ, Van Aert S, van den Bos A, Van Dyck D. den Dekker AJ, et al. Among authors: van dyck d, van den bos a, van aert s. Ultramicroscopy. 2005 Sep;104(2):83-106. doi: 10.1016/j.ultramic.2005.03.001. Epub 2005 Apr 7. Ultramicroscopy. 2005. PMID: 15982520

10

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.

Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D, Chen JH. Van Aert S, et al. Among authors: van dyck d, van den bos a. Ultramicroscopy. 2005 Sep;104(2):107-25. doi: 10.1016/j.ultramic.2005.03.002. Epub 2005 Apr 7. Ultramicroscopy. 2005. PMID: 15982521

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