Improved accuracy and robustness of electron density profiles from JET's X-mode frequency-modulated continuous-wave reflectometers.
Morales RB, Salmi A, Abreu P, Amador CHS, Appel L, Carman P, Fessey J, Flanagan J, Fontana M, Frassinetti L, Giroud C, Hacquin S, Heuraux S, Meneses L, Ronchi G, Sabot R, Silva A, Sirinelli A, Szepesi G, Taylor D, Terranova D.
Morales RB, et al. Among authors: meneses l.
Rev Sci Instrum. 2024 Apr 1;95(4):043501. doi: 10.1063/5.0176696.
Rev Sci Instrum. 2024.
PMID: 38557886