Surface sensitivity of atomic resolution secondary electron imaging.
Saitoh K, Oyobe T, Igarashi K, Sato T, Matsumoto H, Inada H, Endo T, Miyata Y, Usami R, Takenobu T.
Saitoh K, et al. Among authors: inada h.
Microscopy (Oxf). 2024 Sep 20:dfae041. doi: 10.1093/jmicro/dfae041. Online ahead of print.
Microscopy (Oxf). 2024.
PMID: 39300960