Development and characterization of wheat- Leymus racemosus translocation lines with resistance to Fusarium Head Blight.
Chen P, Liu W, Yuan J, Wang X, Zhou B, Wang S, Zhang S, Feng Y, Yang B, Liu G, Liu D, Qi L, Zhang P, Friebe B, Gill BS.
Chen P, et al. Among authors: liu w, liu g, liu d.
Theor Appl Genet. 2005 Sep;111(5):941-8. doi: 10.1007/s00122-005-0026-z. Epub 2005 Oct 18.
Theor Appl Genet. 2005.
PMID: 16044268