Bhaskaran M - Search Results

1

Influence of electric field on SERS: frequency effects, intensity changes, and susceptible bonds.

Sriram S, Bhaskaran M, Chen S, Jayawardhana S, Stoddart PR, Liu JZ, Medhekar NV, Kalantar-Zadeh K, Mitchell A. Sriram S, et al. Among authors: bhaskaran m. J Am Chem Soc. 2012 Mar 14;134(10):4646-53. doi: 10.1021/ja208893q. Epub 2011 Dec 1. J Am Chem Soc. 2012. PMID: 22087708

2

Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques.

Bhaskaran M, Sriram S, Holland AS, Evans PJ. Bhaskaran M, et al. Micron. 2009 Jan;40(1):99-103. doi: 10.1016/j.micron.2007.12.008. Epub 2008 Jan 6. Micron. 2009. PMID: 18276146

3

Influence of oxygen partial pressure on the composition and orientation of strontium-doped lead zirconate titanate thin films.

Sriram S, Bhaskaran M, du Plessis J, Short KT, Sivan VP, Holland AS. Sriram S, et al. Among authors: bhaskaran m. Micron. 2009 Jan;40(1):104-8. doi: 10.1016/j.micron.2007.12.009. Epub 2008 Jan 6. Micron. 2009. PMID: 18276147

4

Thin film piezoelectric response characterisation using atomic force microscopy with standard contact mode imaging.

Sriram S, Bhaskaran M, Short KT, Matthews GI, Holland AS. Sriram S, et al. Among authors: bhaskaran m. Micron. 2009 Jan;40(1):109-13. doi: 10.1016/j.micron.2008.01.007. Epub 2008 Jan 20. Micron. 2009. PMID: 18296057

5

Microstructural investigation of nickel silicide thin films and the silicide-silicon interface using transmission electron microscopy.

Bhaskaran M, Sriram S, Mitchell DR, Short KT, Holland AS, Mitchell A. Bhaskaran M, et al. Micron. 2009 Jan;40(1):11-4. doi: 10.1016/j.micron.2008.01.012. Epub 2008 Feb 2. Micron. 2009. PMID: 18337112

6

In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon.

Bhaskaran M, Sriram S, Perova TS, Ermakov V, Thorogood GJ, Short KT, Holland AS. Bhaskaran M, et al. Micron. 2009 Jan;40(1):89-93. doi: 10.1016/j.micron.2008.03.007. Epub 2008 Apr 4. Micron. 2009. PMID: 18467110

7

Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates.

Sriram S, Bhaskaran M, Mitchell DR, Short KT, Holland AS, Mitchell A. Sriram S, et al. Among authors: bhaskaran m. Microsc Microanal. 2009 Feb;15(1):30-5. doi: 10.1017/S1431927609090072. Microsc Microanal. 2009. PMID: 19144255 Free article.

8

In situ investigation of thermally influenced phase transformations in (Pb 0.92 Sr 0.08)(Zr 0.65 Ti 0.35)O3 thin films using micro-Raman spectroscopy and X-ray diffraction.

Sriram S, Bhaskaran M, Perova TS, Melnikov VA, Holland AS. Sriram S, et al. Among authors: bhaskaran m. IEEE Trans Ultrason Ferroelectr Freq Control. 2009 Feb;56(2):241-5. doi: 10.1109/TUFFC.2009.1032. IEEE Trans Ultrason Ferroelectr Freq Control. 2009. PMID: 19251510

9

Nanocolumnar Preferentially Oriented PSZT Thin Films Deposited on Thermally Grown Silicon Dioxide.

Sriram S, Bhaskaran M, Mitchell A, Mitchell DR, Kostovski G. Sriram S, et al. Among authors: bhaskaran m. Nanoscale Res Lett. 2009 Jan;4(1):29-33. doi: 10.1007/s11671-008-9197-2. Epub 2008 Nov 11. Nanoscale Res Lett. 2009. PMID: 20596364 Free PMC article.

10

Surface morphology induced localized electric field and piezoresponse enhancement in nanostructured thin films.

Sriram S, Bhaskaran M, Ahluwalia R, Nguyen TG, Ng N, Srolovitz DJ, Kalantar-Zadeh K, Mitchell A. Sriram S, et al. Among authors: bhaskaran m. ACS Nano. 2011 Feb 22;5(2):1067-72. doi: 10.1021/nn103561u. Epub 2011 Jan 27. ACS Nano. 2011. PMID: 21271737

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