Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data.
Müller K, Schowalter M, Jansen J, Tsuda K, Titantah J, Lamoen D, Rosenauer A.
Müller K, et al. Among authors: schowalter m.
Ultramicroscopy. 2009 Jun;109(7):802-14. doi: 10.1016/j.ultramic.2009.03.029. Epub 2009 Mar 21.
Ultramicroscopy. 2009.
PMID: 19386419
A deviation of more than 20% from isolated atom scattering data is observed, whereas close agreement is found with structure factors obtained from density functional theory [A. Rosenauer, M. Schowalter, F. Glas, D. Lamoen, Phys. Rev. B 72 (2005), 085326-1], which ac …
A deviation of more than 20% from isolated atom scattering data is observed, whereas close agreement is found with structure factors obtaine …