Uhlén F - Search Results

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Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser.

Nilsson D, Uhlén F, Holmberg A, Hertz HM, Schropp A, Patommel J, Hoppe R, Seiboth F, Meier V, Schroer CG, Galtier E, Nagler B, Lee HJ, Vogt U. Nilsson D, et al. Among authors: uhlen f. Opt Lett. 2012 Dec 15;37(24):5046-8. doi: 10.1364/OL.37.005046. Opt Lett. 2012. PMID: 23258000

Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser.

Uhlén F, Nilsson D, Holmberg A, Hertz HM, Schroer CG, Seiboth F, Patommel J, Meier V, Hoppe R, Schropp A, Lee HJ, Nagler B, Galtier E, Krzywinski J, Sinn H, Vogt U. Uhlén F, et al. Opt Express. 2013 Apr 8;21(7):8051-61. doi: 10.1364/OE.21.008051. Opt Express. 2013. PMID: 23571895 Free article.

Ronchi test for characterization of X-ray nanofocusing optics and beamlines.

Uhlén F, Rahomäki J, Nilsson D, Seiboth F, Sanz C, Wagner U, Rau C, Schroer CG, Vogt U. Uhlén F, et al. J Synchrotron Radiat. 2014 Sep;21(Pt 5):1105-9. doi: 10.1107/S160057751401323X. Epub 2014 Aug 1. J Synchrotron Radiat. 2014. PMID: 25177999

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging.

Schropp A, Hoppe R, Meier V, Patommel J, Seiboth F, Lee HJ, Nagler B, Galtier EC, Arnold B, Zastrau U, Hastings JB, Nilsson D, Uhlén F, Vogt U, Hertz HM, Schroer CG. Schropp A, et al. Among authors: uhlen f. Sci Rep. 2013;3:1633. doi: 10.1038/srep01633. Sci Rep. 2013. PMID: 23567281 Free PMC article.

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