Bleuet P - Search Results

1

Specifications for hard condensed matter specimens for three-dimensional high-resolution tomographies.

Bleuet P, Audoit G, Barnes JP, Bertheau J, Dabin Y, Dansas H, Fabbri JM, Florin B, Gergaud P, Grenier A, Haberfehlner G, Lay E, Laurencin J, Serra R, Villanova J. Bleuet P, et al. Microsc Microanal. 2013 Jun;19(3):726-39. doi: 10.1017/S1431927613000330. Epub 2013 Apr 10. Microsc Microanal. 2013. PMID: 23575375

2

3D correlative morphological and elemental characterization of materials at the deep submicrometre scale.

Priebe A, Goret G, Bleuet P, Audoit G, Laurencin J, Barnes JP. Priebe A, et al. Among authors: bleuet p. J Microsc. 2016 Nov;264(2):247-251. doi: 10.1111/jmi.12458. Epub 2016 Aug 11. J Microsc. 2016. PMID: 27513607

3

X-ray micro Laue diffraction tomography analysis of a solid oxide fuel cell.

Ferreira Sanchez D, Villanova J, Laurencin J, Micha JS, Montani A, Gergaud P, Bleuet P. Ferreira Sanchez D, et al. Among authors: bleuet p. J Appl Crystallogr. 2015 Feb 21;48(Pt 2):357-364. doi: 10.1107/S1600576715002447. eCollection 2015 Apr 1. J Appl Crystallogr. 2015. PMID: 25844076 Free PMC article.

4

Selenium segregation in femtosecond-laser hyperdoped silicon revealed by electron tomography.

Haberfehlner G, Smith MJ, Idrobo JC, Auvert G, Sher MJ, Winkler MT, Mazur E, Gambacorti N, Gradečak S, Bleuet P. Haberfehlner G, et al. Among authors: bleuet p. Microsc Microanal. 2013 Jun;19(3):716-25. doi: 10.1017/S1431927613000342. Epub 2013 Apr 10. Microsc Microanal. 2013. PMID: 23570747

5

Deep sub micrometer imaging of defects in copper pillars by X-ray tomography in a SEM.

Laloum D, Lorut F, Bertheau J, Audoit G, Bleuet P. Laloum D, et al. Among authors: bleuet p. Micron. 2014 Mar;58:1-8. doi: 10.1016/j.micron.2013.10.014. Epub 2013 Nov 5. Micron. 2014. PMID: 24316374

6

Reduction of the scanning time by total variation minimization reconstruction for X-ray tomography in a SEM.

Laloum D, Printemps T, Sanchez DF, Lorut F, Audoit G, Bleuet P. Laloum D, et al. Among authors: bleuet p. J Microsc. 2014 Nov;256(2):90-9. doi: 10.1111/jmi.12162. Epub 2014 Aug 5. J Microsc. 2014. PMID: 25131954

7

3D spatial resolution improvement by dual-axis electron tomography: application to tri-gate transistors.

Haberfehlner G, Serra R, Cooper D, Barraud S, Bleuet P. Haberfehlner G, et al. Among authors: bleuet p. Ultramicroscopy. 2014 Jan;136:144-53. doi: 10.1016/j.ultramic.2013.09.006. Epub 2013 Oct 4. Ultramicroscopy. 2014. PMID: 24141183

8

A hard x-ray nanoprobe for scanning and projection nanotomography.

Bleuet P, Cloetens P, Gergaud P, Mariolle D, Chevalier N, Tucoulou R, Susini J, Chabli A. Bleuet P, et al. Rev Sci Instrum. 2009 May;80(5):056101. doi: 10.1063/1.3117489. Rev Sci Instrum. 2009. PMID: 19485538

9

State-of-the-Art Three-Dimensional Chemical Characterization of Solid Oxide Fuel Cell Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Tomography.

Priebe A, Bleuet P, Goret G, Laurencin J, Montinaro D, Barnes JP. Priebe A, et al. Among authors: bleuet p. Microsc Microanal. 2016 Dec;22(6):1261-1269. doi: 10.1017/S1431927616012502. Microsc Microanal. 2016. PMID: 27998367

10

Self-adapting denoising, alignment and reconstruction in electron tomography in materials science.

Printemps T, Mula G, Sette D, Bleuet P, Delaye V, Bernier N, Grenier A, Audoit G, Gambacorti N, Hervé L. Printemps T, et al. Among authors: bleuet p. Ultramicroscopy. 2016 Jan;160:23-34. doi: 10.1016/j.ultramic.2015.09.007. Epub 2015 Sep 24. Ultramicroscopy. 2016. PMID: 26413937

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