Frank L - Search Results

1

Very low energy electron microscopy of graphene flakes.

Mikmeková E, Bouyanfif H, Lejeune M, Müllerová I, Hovorka M, Unčovský M, Frank L. Mikmeková E, et al. Among authors: frank l. J Microsc. 2013 Aug;251(2):123-7. doi: 10.1111/jmi.12049. Epub 2013 May 20. J Microsc. 2013. PMID: 23691920

2

The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites.

Matsuda K, Ikeno S, Müllerová I, Frank L. Matsuda K, et al. Among authors: frank l. J Electron Microsc (Tokyo). 2005 Apr;54(2):109-17. doi: 10.1093/jmicro/dfi030. Epub 2005 Jun 30. J Electron Microsc (Tokyo). 2005. PMID: 15994206

3

High-pass energy-filtered photoemission electron microscopy imaging of dopants in silicon.

Hovorka M, Frank L, Valdaitsev D, Nepijko SA, Elmers HS, Schönhense G. Hovorka M, et al. Among authors: frank l. J Microsc. 2008 Apr;230(Pt 1):42-7. doi: 10.1111/j.1365-2818.2008.01953.x. J Microsc. 2008. PMID: 18387038

4

Imaging of the boron doping in silicon using low energy SEM.

Müllerová I, El-Gomati MM, Frank L. Müllerová I, et al. Among authors: frank l. Ultramicroscopy. 2002 Dec;93(3-4):223-43. doi: 10.1016/s0304-3991(02)00279-6. Ultramicroscopy. 2002. PMID: 12492233

5

A method of imaging ultrathin foils with very low energy electrons.

Müllerová I, Hovorka M, Frank L. Müllerová I, et al. Among authors: frank l. Ultramicroscopy. 2012 Aug;119:78-81. doi: 10.1016/j.ultramic.2012.01.002. Epub 2012 Jan 14. Ultramicroscopy. 2012. PMID: 22326390

6

Simulations and measurements in scanning electron microscopes at low electron energy.

Walker CG, Frank L, Müllerová I. Walker CG, et al. Among authors: frank l. Scanning. 2016 Nov;38(6):802-818. doi: 10.1002/sca.21330. Epub 2016 Jun 10. Scanning. 2016. PMID: 27285145 Free article. Review.

7

Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer.

Konvalina I, Daniel B, Zouhar M, Paták A, Müllerová I, Frank L, Piňos J, Průcha L, Radlička T, Werner WSM, Mikmeková EM. Konvalina I, et al. Among authors: frank l. Nanomaterials (Basel). 2021 Sep 18;11(9):2435. doi: 10.3390/nano11092435. Nanomaterials (Basel). 2021. PMID: 34578750 Free PMC article.

8

Scanning electron microscopy of nonconductive specimens at critical energies in a cathode lens system.

Frank L, Zadrazil M, Müllerová I. Frank L, et al. Scanning. 2001 Jan-Feb;23(1):36-50. doi: 10.1002/sca.4950230106. Scanning. 2001. PMID: 11272335

9

The injected-charge contrast mechanism in scanned imaging of doped semiconductors by very slow electrons.

Frank L, Müllerová I. Frank L, et al. Ultramicroscopy. 2005 Dec;106(1):28-36. doi: 10.1016/j.ultramic.2005.06.004. Epub 2005 Jul 5. Ultramicroscopy. 2005. PMID: 16054756

10

Imaging of tissue sections with very slow electrons.

Frank L, Nebesářová J, Vancová M, Paták A, Müllerová I. Frank L, et al. Ultramicroscopy. 2015 Jan;148:146-150. doi: 10.1016/j.ultramic.2014.10.009. Epub 2014 Oct 27. Ultramicroscopy. 2015. PMID: 25461591

Save citations to file

Email citations

Send citations to clipboard

Add to Collections

Add to My Bibliography

Create a file for external citation management software

Your saved search

Your RSS Feed

My Custom Filters

Publication date

Text availability

Article attribute

Article type

Article Language

Species

Sex

Age

Other

1,417 results

Search Page

Filters