Müllerová I - Search Results

1

Very low energy electron microscopy of graphene flakes.

Mikmeková E, Bouyanfif H, Lejeune M, Müllerová I, Hovorka M, Unčovský M, Frank L. Mikmeková E, et al. Among authors: mullerova i. J Microsc. 2013 Aug;251(2):123-7. doi: 10.1111/jmi.12049. Epub 2013 May 20. J Microsc. 2013. PMID: 23691920

2

A novel in-lens detector for electrostatic scanning LEEM mini-column.

Frank L, Mullerova I I, el Gomati MM. Frank L, et al. Among authors: mullerova i i. Ultramicroscopy. 2000 Mar;81(2):99-110. doi: 10.1016/s0304-3991(99)00156-4. Ultramicroscopy. 2000. PMID: 10998794

3

Scanning electron microscopy of nonconductive specimens at critical energies in a cathode lens system.

Frank L, Zadrazil M, Müllerová I. Frank L, et al. Among authors: mullerova i. Scanning. 2001 Jan-Feb;23(1):36-50. doi: 10.1002/sca.4950230106. Scanning. 2001. PMID: 11272335

4

Imaging of the boron doping in silicon using low energy SEM.

Müllerová I, El-Gomati MM, Frank L. Müllerová I, et al. Ultramicroscopy. 2002 Dec;93(3-4):223-43. doi: 10.1016/s0304-3991(02)00279-6. Ultramicroscopy. 2002. PMID: 12492233

5

The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites.

Matsuda K, Ikeno S, Müllerová I, Frank L. Matsuda K, et al. Among authors: mullerova i. J Electron Microsc (Tokyo). 2005 Apr;54(2):109-17. doi: 10.1093/jmicro/dfi030. Epub 2005 Jun 30. J Electron Microsc (Tokyo). 2005. PMID: 15994206

6

The injected-charge contrast mechanism in scanned imaging of doped semiconductors by very slow electrons.

Frank L, Müllerová I. Frank L, et al. Among authors: mullerova i. Ultramicroscopy. 2005 Dec;106(1):28-36. doi: 10.1016/j.ultramic.2005.06.004. Epub 2005 Jul 5. Ultramicroscopy. 2005. PMID: 16054756

7

Corrections of magnification and focusing in a cathode lens-equipped scanning electron microscope.

Zobacová J, Zobac M, Oral M, Müllerová I, Frank L. Zobacová J, et al. Among authors: mullerova i. Scanning. 2006 May-Jun;28(3):155-63. doi: 10.1002/sca.4950280304. Scanning. 2006. PMID: 16878787

8

Single electron response of the scintillator-light guide-photomultiplier detector.

Novák L, Müllerová I. Novák L, et al. Among authors: mullerova i. J Microsc. 2009 Jan;233(1):76-83. doi: 10.1111/j.1365-2818.2008.03096.x. J Microsc. 2009. PMID: 19196414

9

Collection of secondary electrons in scanning electron microscopes.

Müllerová I, Konvalina I. Müllerová I, et al. J Microsc. 2009 Dec;236(3):203-10. doi: 10.1111/j.1365-2818.2009.03189.x. J Microsc. 2009. PMID: 19941560

10

A method of imaging ultrathin foils with very low energy electrons.

Müllerová I, Hovorka M, Frank L. Müllerová I, et al. Ultramicroscopy. 2012 Aug;119:78-81. doi: 10.1016/j.ultramic.2012.01.002. Epub 2012 Jan 14. Ultramicroscopy. 2012. PMID: 22326390

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