Thomasset M - Search Results

1

High-efficiency B₄C/Mo₂C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4 keV.

Choueikani F, Lagarde B, Delmotte F, Krumrey M, Bridou F, Thomasset M, Meltchakov E, Polack F. Choueikani F, et al. Among authors: thomasset m. Opt Lett. 2014 Apr 1;39(7):2141-4. doi: 10.1364/OL.39.002141. Opt Lett. 2014. PMID: 24686695

2

Al/Mo/SiC multilayer diffraction gratings with broadband efficiency in the extreme ultraviolet.

Mahmoud AHK, de Rossi S, Meltchakov E, Capitanio B, Thomasset M, Vallet M, Héripré E, Delmotte F. Mahmoud AHK, et al. Among authors: thomasset m. Opt Express. 2022 Oct 10;30(21):38319-38338. doi: 10.1364/OE.468568. Opt Express. 2022. PMID: 36258401 Free article.

3

Design and performance of AERHA, a high acceptance high resolution soft x-ray spectrometer.

Chiuzbăian SG, Hague CF, Avila A, Delaunay R, Jaouen N, Sacchi M, Polack F, Thomasset M, Lagarde B, Nicolaou A, Brignolo S, Baumier C, Lüning J, Mariot JM. Chiuzbăian SG, et al. Among authors: thomasset m. Rev Sci Instrum. 2014 Apr;85(4):043108. doi: 10.1063/1.4871362. Rev Sci Instrum. 2014. PMID: 24784594

4

Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL.

Thomasset M, Dvorak J, Brochet S, Dennetiere D, Polack F. Thomasset M, et al. Rev Sci Instrum. 2019 Feb;90(2):021714. doi: 10.1063/1.5055284. Rev Sci Instrum. 2019. PMID: 30831694

5

Two-dimensional stitching interferometry for self-calibration of high-order additive systematic errors.

Huang L, Wang T, Nicolas J, Vivo A, Polack F, Thomasset M, Zuo C, Tayabaly K, Wook Kim D, Idir M. Huang L, et al. Among authors: thomasset m. Opt Express. 2019 Sep 16;27(19):26940-26956. doi: 10.1364/OE.27.026940. Opt Express. 2019. PMID: 31674564 Free article.

6

Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region.

Chauvet C, Polack F, Silly MG, Lagarde B, Thomasset M, Kubsky S, Duval JP, Risterucci P, Pilette B, Yao I, Bergeard N, Sirotti F. Chauvet C, et al. Among authors: thomasset m. J Synchrotron Radiat. 2011 Sep;18(Pt 5):761-4. doi: 10.1107/S0909049511023119. Epub 2011 Jul 8. J Synchrotron Radiat. 2011. PMID: 21862857

7

Surface shape determination with a stitching Michelson interferometer and accuracy evaluation.

Polack F, Thomasset M, Brochet S, Dennetiere D. Polack F, et al. Among authors: thomasset m. Rev Sci Instrum. 2019 Feb;90(2):021708. doi: 10.1063/1.5061930. Rev Sci Instrum. 2019. PMID: 30831756

8

A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors.

Floriot J, Levecq X, Bucourt S, Thomasset M, Polack F, Idir M, Mercère P, Moreno T, Brochet S. Floriot J, et al. Among authors: thomasset m. J Synchrotron Radiat. 2008 Mar;15(Pt 2):134-9. doi: 10.1107/S0909049507066083. Epub 2008 Feb 19. J Synchrotron Radiat. 2008. PMID: 18296778

9

Characterization of Carbon-Contaminated B₄C-Coated Optics after Chemically Selective Cleaning with Low-Pressure RF Plasma.

Moreno Fernández H, Rogler D, Sauthier G, Thomasset M, Dietsch R, Carlino V, Pellegrin E. Moreno Fernández H, et al. Among authors: thomasset m. Sci Rep. 2018 Jan 22;8(1):1293. doi: 10.1038/s41598-018-19273-6. Sci Rep. 2018. PMID: 29358628 Free PMC article.

10

Experimental study and modeling of extreme ultraviolet 4000 lines/mm diffraction gratings coated with periodic and aperiodic Al/Mo/SiC multilayers.

Mahmoud AHK, de Rossi S, Meltchakov E, Capitanio B, Thomasset M, Vallet M, Delmotte F. Mahmoud AHK, et al. Among authors: thomasset m. Appl Opt. 2024 Jan 1;63(1):30-41. doi: 10.1364/AO.505546. Appl Opt. 2024. PMID: 38175002

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