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In situ TEM analysis of resistive switching in manganite based thin-film heterostructures.
Nanoscale. 2014 Aug 21;6(16):9852-62. doi: 10.1039/c4nr02020k.
Nanoscale. 2014.
PMID: 25029190
Time-resolved near-edge x-ray absorption fine structure spectroscopy on photo-induced phase transitions using a tabletop soft-x-ray spectrometer.
Grossmann P, Rajkovic I, Moré R, Norpoth J, Techert S, Jooss C, Mann K.
Grossmann P, et al. Among authors: norpoth j.
Rev Sci Instrum. 2012 May;83(5):053110. doi: 10.1063/1.4718936.
Rev Sci Instrum. 2012.
PMID: 22667605
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