van de Kruijs RW - Search Results

1

High-reflectance La/B-based multilayer mirror for 6.x nm wavelength.

Kuznetsov DS, Yakshin AE, Sturm JM, van de Kruijs RW, Louis E, Bijkerk F. Kuznetsov DS, et al. Among authors: van de kruijs rw. Opt Lett. 2015 Aug 15;40(16):3778-81. doi: 10.1364/OL.40.003778. Opt Lett. 2015. PMID: 26274658

2

Spectral-purity-enhancing layer for multilayer mirrors.

van Herpen MM, van de Kruijs RW, Klunder DJ, Louis E, Yakshin AE, van der Westen SA, Bijkerk F, Banine V. van Herpen MM, et al. Among authors: van de kruijs rw, van der westen sa. Opt Lett. 2008 Mar 15;33(6):560-2. doi: 10.1364/ol.33.000560. Opt Lett. 2008. PMID: 18347709

3

Infrared suppression by hybrid EUV multilayer--IR etalon structures.

Medvedev VV, Yakshin AE, van de Kruijs RW, Krivtsun VM, Yakunin AM, Koshelev KN, Bijkerk F. Medvedev VV, et al. Among authors: van de kruijs rw. Opt Lett. 2011 Sep 1;36(17):3344-6. doi: 10.1364/OL.36.003344. Opt Lett. 2011. PMID: 21886205

4

Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectors.

Medvedev VV, Yakshin AE, van de Kruijs RW, Krivtsun VM, Yakunin AM, Koshelev KN, Bijkerk F. Medvedev VV, et al. Among authors: van de kruijs rw. Opt Lett. 2012 Apr 1;37(7):1169-71. doi: 10.1364/OL.37.001169. Opt Lett. 2012. PMID: 22466184

5

UV spectral filtering by surface structured multilayer mirrors.

Huang Q, Paardekooper DM, Zoethout E, Medvedev VV, van de Kruijs R, Bosgra J, Louis E, Bijkerk F. Huang Q, et al. Opt Lett. 2014 Mar 1;39(5):1185-8. doi: 10.1364/OL.39.001185. Opt Lett. 2014. PMID: 24690702

6

Short period La/B and LaN/B multilayer mirrors for ~6.8 nm wavelength.

Makhotkin IA, Zoethout E, van de Kruijs R, Yakunin SN, Louis E, Yakunin AM, Banine V, Müllender S, Bijkerk F. Makhotkin IA, et al. Opt Express. 2013 Dec 2;21(24):29894-904. doi: 10.1364/OE.21.029894. Opt Express. 2013. PMID: 24514540 Free article.

7

Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements.

Loch RA, Dubrouil A, Sobierajski R, Descamps D, Fabre B, Lidon P, van de Kruijs RW, Boekhout F, Gullikson E, Gaudin J, Louis E, Bijkerk F, Mével E, Petit S, Constant E, Mairesse Y. Loch RA, et al. Among authors: van de kruijs rw. Opt Lett. 2011 Sep 1;36(17):3386-8. doi: 10.1364/OL.36.003386. Opt Lett. 2011. PMID: 21886219

8

Subwavelength single layer absorption resonance antireflection coatings.

Huber SP, van de Kruijs RW, Yakshin AE, Zoethout E, Boller KJ, Bijkerk F. Huber SP, et al. Among authors: van de kruijs rw. Opt Express. 2014 Jan 13;22(1):490-7. doi: 10.1364/OE.22.000490. Opt Express. 2014. PMID: 24515009 Free article.

9

Microstructure of Mo/Si multilayers with B4C diffusion barrier layers.

Nedelcu I, van de Kruijs RW, Yakshin AE, Bijkerk F. Nedelcu I, et al. Among authors: van de kruijs rw. Appl Opt. 2009 Jan 10;48(2):155-60. doi: 10.1364/ao.48.000155. Appl Opt. 2009. PMID: 19137023

10

Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors.

Bosgra J, Zoethout E, van der Eerden AM, Verhoeven J, van de Kruijs RW, Yakshin AE, Bijkerk F. Bosgra J, et al. Among authors: van de kruijs rw, van der eerden am. Appl Opt. 2012 Dec 20;51(36):8541-8. doi: 10.1364/AO.51.008541. Appl Opt. 2012. PMID: 23262592

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