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Continuum models of focused electron beam induced processing.
Beilstein J Nanotechnol. 2015 Jul 14;6:1518-40. doi: 10.3762/bjnano.6.157. eCollection 2015.
Beilstein J Nanotechnol. 2015.
PMID: 26425405
Free PMC article.
Review.
Dose and energy dependence of mechanical properties of focused electron-beam-induced pillar deposits from Cu(C5HF6O2)2.
Friedli V, Utke I, Mølhave K, Michler J.
Friedli V, et al.
Nanotechnology. 2009 Sep 23;20(38):385304. doi: 10.1088/0957-4484/20/38/385304. Epub 2009 Aug 28.
Nanotechnology. 2009.
PMID: 19713594
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