Hÿtch M - Search Results

1

Differential phase-contrast dark-field electron holography for strain mapping.

Denneulin T, Houdellier F, Hÿtch M. Denneulin T, et al. Among authors: hytch m. Ultramicroscopy. 2016 Jan;160:98-109. doi: 10.1016/j.ultramic.2015.10.002. Epub 2015 Oct 8. Ultramicroscopy. 2016. PMID: 26476802

2

Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique.

Warot-Fonrose B, Houdellier F, Hÿtch MJ, Calmels L, Serin V, Snoeck E. Warot-Fonrose B, et al. Among authors: hytch mj. Ultramicroscopy. 2008 Apr;108(5):393-8. doi: 10.1016/j.ultramic.2007.05.013. Epub 2007 Jun 12. Ultramicroscopy. 2008. PMID: 17619085

3

Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF).

Houdellier F, Hÿtch MJ. Houdellier F, et al. Among authors: hytch mj. Ultramicroscopy. 2008 Feb;108(3):285-94. doi: 10.1016/j.ultramic.2007.08.016. Epub 2007 Oct 30. Ultramicroscopy. 2008. PMID: 18061351

4

Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy.

Hüe F, Hÿtch M, Bender H, Houdellier F, Claverie A. Hüe F, et al. Among authors: hytch m. Phys Rev Lett. 2008 Apr 18;100(15):156602. doi: 10.1103/PhysRevLett.100.156602. Epub 2008 Apr 17. Phys Rev Lett. 2008. PMID: 18518137

5

Nanoscale holographic interferometry for strain measurements in electronic devices.

Hÿtch M, Houdellier F, Hüe F, Snoeck E. Hÿtch M, et al. Nature. 2008 Jun 19;453(7198):1086-9. doi: 10.1038/nature07049. Nature. 2008. PMID: 18563161

6

Dark-field electron holography for the measurement of geometric phase.

Hÿtch MJ, Houdellier F, Hüe F, Snoeck E. Hÿtch MJ, et al. Ultramicroscopy. 2011 Jul;111(8):1328-37. doi: 10.1016/j.ultramic.2011.04.008. Epub 2011 Apr 30. Ultramicroscopy. 2011. PMID: 21864773

7

A new linear transfer theory and characterization method for image detectors. Part II: experiment.

Lubk A, Röder F, Niermann T, Gatel C, Joulie S, Houdellier F, Magén C, Hÿtch MJ. Lubk A, et al. Ultramicroscopy. 2012 Apr;115:78-87. doi: 10.1016/j.ultramic.2012.01.011. Epub 2012 Feb 3. Ultramicroscopy. 2012. PMID: 22424716

8

Dynamic scattering theory for dark-field electron holography of 3D strain fields.

Lubk A, Javon E, Cherkashin N, Reboh S, Gatel C, Hÿtch M. Lubk A, et al. Among authors: hytch m. Ultramicroscopy. 2014 Jan;136:42-9. doi: 10.1016/j.ultramic.2013.07.007. Epub 2013 Jul 29. Ultramicroscopy. 2014. PMID: 24012934

9

Determining the work function of a carbon-cone cold-field emitter by in situ electron holography.

de Knoop L, Houdellier F, Gatel C, Masseboeuf A, Monthioux M, Hÿtch M. de Knoop L, et al. Among authors: hytch m. Micron. 2014 Aug;63:2-8. doi: 10.1016/j.micron.2014.03.005. Epub 2014 Mar 16. Micron. 2014. PMID: 24702951

10

Dynamical effects in strain measurements by dark-field electron holography.

Javon E, Lubk A, Cours R, Reboh S, Cherkashin N, Houdellier F, Gatel C, Hÿtch MJ. Javon E, et al. Among authors: hytch mj. Ultramicroscopy. 2014 Dec;147:70-85. doi: 10.1016/j.ultramic.2014.06.005. Epub 2014 Jun 30. Ultramicroscopy. 2014. PMID: 25062040

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