Strength of shock-loaded single-crystal tantalum [100] determined using in situ broadband x-ray Laue diffraction.
Comley AJ, Maddox BR, Rudd RE, Prisbrey ST, Hawreliak JA, Orlikowski DA, Peterson SC, Satcher JH, Elsholz AJ, Park HS, Remington BA, Bazin N, Foster JM, Graham P, Park N, Rosen PA, Rothman SR, Higginbotham A, Suggit M, Wark JS.
Comley AJ, et al. Among authors: higginbotham a.
Phys Rev Lett. 2013 Mar 15;110(11):115501. doi: 10.1103/PhysRevLett.110.115501. Epub 2013 Mar 11.
Phys Rev Lett. 2013.
PMID: 25166552