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Subnanometer localization accuracy in widefield optical microscopy.
Copeland CR, Geist J, McGray CD, Aksyuk VA, Liddle JA, Ilic BR, Stavis SM. Copeland CR, et al. Among authors: aksyuk va. Light Sci Appl. 2018 Jul 11;7:31. doi: 10.1038/s41377-018-0031-z. eCollection 2018. Light Sci Appl. 2018. PMID: 30839614 Free PMC article.
The Nanolithography Toolbox.
Balram KC, Westly DA, Davanço M, Grutter KE, Li Q, Michels T, Ray CH, Yu L, Kasica RJ, Wallin CB, Gilbert IJ, Bryce BA, Simelgor G, Topolancik J, Lobontiu N, Liu Y, Neuzil P, Svatos V, Dill KA, Bertrand NA, Metzler MG, Lopez G, Czaplewski DA, Ocola L, Srinivasan KA, Stavis SM, Aksyuk VA, Liddle JA, Krylov S, Ilic BR. Balram KC, et al. Among authors: aksyuk va. J Res Natl Inst Stand Technol. 2016 Oct 19;121:464-475. doi: 10.6028/jres.121.024. eCollection 2016. J Res Natl Inst Stand Technol. 2016. PMID: 34434635 Free PMC article.
A system for probing Casimir energy corrections to the condensation energy.
Pérez-Morelo D, Stange A, Lally RW, Barrett LK, Imboden M, Som A, Campbell DK, Aksyuk VA, Bishop DJ. Pérez-Morelo D, et al. Among authors: aksyuk va. Microsyst Nanoeng. 2020 Dec 28;6:115. doi: 10.1038/s41378-020-00221-2. eCollection 2020. Microsyst Nanoeng. 2020. PMID: 33414928 Free PMC article.
54 results