Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography.
Hill MO, Calvo-Almazan I, Allain M, Holt MV, Ulvestad A, Treu J, Koblmüller G, Huang C, Huang X, Yan H, Nazaretski E, Chu YS, Stephenson GB, Chamard V, Lauhon LJ, Hruszkewycz SO.
Hill MO, et al. Among authors: chamard v.
Nano Lett. 2018 Feb 14;18(2):811-819. doi: 10.1021/acs.nanolett.7b04024. Epub 2018 Jan 24.
Nano Lett. 2018.
PMID: 29345956