Zhang RJ - Search Results

1

Optical Constants and Band Gap Evolution with Phase Transition in Sub-20-nm-Thick TiO₂ Films Prepared by ALD.

Shi YJ, Zhang RJ, Zheng H, Li DH, Wei W, Chen X, Sun Y, Wei YF, Lu HL, Dai N, Chen LY. Shi YJ, et al. Among authors: zhang rj. Nanoscale Res Lett. 2017 Dec;12(1):243. doi: 10.1186/s11671-017-2011-2. Epub 2017 Mar 31. Nanoscale Res Lett. 2017. PMID: 28363244 Free PMC article.

2

Analytical study of the principal angle used in optical experiments.

Zhu XS, Zhao HB, Zhang RJ, Ma YS, Liu Z, Li J, Shen ZC, Wang SY, Chen LY. Zhu XS, et al. Among authors: zhang rj. Appl Opt. 2002 May 1;41(13):2592-5. doi: 10.1364/ao.41.002592. Appl Opt. 2002. PMID: 12009172

3

Study of the new ellipsometric measurement method using integrated analyzer in parallel mode.

Mao PH, Zheng YX, Chen YR, Cai QY, Zhang RJ, Chen LY. Mao PH, et al. Among authors: zhang rj. Opt Express. 2009 May 11;17(10):8641-50. doi: 10.1364/oe.17.008641. Opt Express. 2009. PMID: 19434197 Free article.

4

Application of image spectrometer to in situ infrared broadband optical monitoring for thin film deposition.

Cai QY, Zheng YX, Zhang DX, Lu WJ, Zhang RJ, Lin W, Zhao HB, Chen LY. Cai QY, et al. Among authors: zhang dx, zhang rj. Opt Express. 2011 Jul 4;19(14):12969-77. doi: 10.1364/OE.19.012969. Opt Express. 2011. PMID: 21747448 Free article.

5

Optical properties of epitaxial BiFeO3 thin film grown on SrRuO3-buffered SrTiO3 substrate.

Xu JP, Zhang RJ, Chen ZH, Wang ZY, Zhang F, Yu X, Jiang AQ, Zheng YX, Wang SY, Chen LY. Xu JP, et al. Among authors: zhang rj, zhang f. Nanoscale Res Lett. 2014 Apr 23;9(1):188. doi: 10.1186/1556-276X-9-188. eCollection 2014. Nanoscale Res Lett. 2014. PMID: 24791162 Free PMC article.

6

The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition.

Wang ZY, Zhang RJ, Lu HL, Chen X, Sun Y, Zhang Y, Wei YF, Xu JP, Wang SY, Zheng YX, Chen LY. Wang ZY, et al. Among authors: zhang rj, zhang y. Nanoscale Res Lett. 2015 Feb 6;10:46. doi: 10.1186/s11671-015-0757-y. eCollection 2015. Nanoscale Res Lett. 2015. PMID: 25852343 Free PMC article.

7

The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopic ellipsometry.

Xu JP, Zhang RJ, Zhang Y, Wang ZY, Chen L, Huang QH, Lu HL, Wang SY, Zheng YX, Chen LY. Xu JP, et al. Among authors: zhang rj, zhang y. Phys Chem Chem Phys. 2016 Jan 28;18(4):3316-21. doi: 10.1039/c5cp05592j. Phys Chem Chem Phys. 2016. PMID: 26752103

8

First-Principles Prediction of Ultralow Lattice Thermal Conductivity of Dumbbell Silicene: A Comparison with Low-Buckled Silicene.

Peng B, Zhang H, Shao H, Xu Y, Zhang R, Lu H, Zhang DW, Zhu H. Peng B, et al. ACS Appl Mater Interfaces. 2016 Aug 17;8(32):20977-85. doi: 10.1021/acsami.6b04211. Epub 2016 Aug 5. ACS Appl Mater Interfaces. 2016. PMID: 27460331

9

Effects of Al Doping on the Properties of ZnO Thin Films Deposited by Atomic Layer Deposition.

Zhai CH, Zhang RJ, Chen X, Zheng YX, Wang SY, Liu J, Dai N, Chen LY. Zhai CH, et al. Among authors: zhang rj. Nanoscale Res Lett. 2016 Dec;11(1):407. doi: 10.1186/s11671-016-1625-0. Epub 2016 Sep 17. Nanoscale Res Lett. 2016. PMID: 27639580 Free PMC article.

10

Effective method to study the thickness-dependent dielectric functions of nanometal thin film.

Hu ET, Cai QY, Zhang RJ, Wei YF, Zhou WC, Wang SY, Zheng YX, Wei W, Chen LY. Hu ET, et al. Among authors: zhang rj. Opt Lett. 2016 Nov 1;41(21):4907-4910. doi: 10.1364/OL.41.004907. Opt Lett. 2016. PMID: 27805647

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