Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements.
Loch RA, Dubrouil A, Sobierajski R, Descamps D, Fabre B, Lidon P, van de Kruijs RW, Boekhout F, Gullikson E, Gaudin J, Louis E, Bijkerk F, Mével E, Petit S, Constant E, Mairesse Y.
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Opt Lett. 2011 Sep 1;36(17):3386-8. doi: 10.1364/OL.36.003386.
Opt Lett. 2011.
PMID: 21886219