X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires.
Davtyan A, Kriegner D, Holý V, AlHassan A, Lewis RB, McDermott S, Geelhaar L, Bahrami D, Anjum T, Ren Z, Richter C, Novikov D, Müller J, Butz B, Pietsch U.
Davtyan A, et al.
J Appl Crystallogr. 2020 Sep 23;53(Pt 5):1310-1320. doi: 10.1107/S1600576720011516. eCollection 2020 Oct 1.
J Appl Crystallogr. 2020.
PMID: 33117111
Free PMC article.