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Reliable Multivalued Conductance States in TaO x Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis.
Lee MJ, Park GS, Seo DH, Kwon SM, Lee HJ, Kim JS, Jung M, You CY, Lee H, Kim HG, Pang SB, Seo S, Hwang H, Park SK. Lee MJ, et al. Among authors: seo s, seo dh. ACS Appl Mater Interfaces. 2018 Sep 5;10(35):29757-29765. doi: 10.1021/acsami.8b09046. Epub 2018 Aug 2. ACS Appl Mater Interfaces. 2018. PMID: 30033726 Free article.
Scanning noise microscopy on graphene devices.
Sung MG, Lee H, Heo K, Byun KE, Kim T, Seo DH, Seo S, Hong S. Sung MG, et al. Among authors: seo s, seo dh. ACS Nano. 2011 Nov 22;5(11):8620-8. doi: 10.1021/nn202135g. Epub 2011 Oct 6. ACS Nano. 2011. PMID: 21978188
Transparent and flexible graphene charge-trap memory.
Kim SM, Song EB, Lee S, Zhu J, Seo DH, Mecklenburg M, Seo S, Wang KL. Kim SM, et al. Among authors: seo s, seo dh. ACS Nano. 2012 Sep 25;6(9):7879-84. doi: 10.1021/nn302193q. Epub 2012 Aug 22. ACS Nano. 2012. PMID: 22889250
5,979 results