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Page 1
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Milov I, Makhotkin IA, Sobierajski R, Medvedev N, Lipp V, Chalupský J, Sturm JM, Tiedtke K, de Vries G, Störmer M, Siewert F, van de Kruijs R, Louis E, Jacyna I, Jurek M, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H, Bijkerk F. Milov I, et al. Among authors: saksl k. Opt Express. 2018 Jul 23;26(15):19665-19685. doi: 10.1364/OE.26.019665. Opt Express. 2018. PMID: 30114137 Free article.
Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 MHz repetition rate.
Sobierajski R, Jacyna I, Dłużewski P, Klepka MT, Klinger D, Pełka JB, Burian T, Hájková V, Juha L, Saksl K, Vozda V, Makhotkin I, Louis E, Faatz B, Tiedtke K, Toleikis S, Enkisch H, Hermann M, Strobel S, Loch RA, Chalupsky J. Sobierajski R, et al. Among authors: saksl k. Opt Express. 2016 Jul 11;24(14):15468-77. doi: 10.1364/OE.24.015468. Opt Express. 2016. PMID: 27410821 Free article.
Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold.
Makhotkin IA, Sobierajski R, Chalupský J, Tiedtke K, de Vries G, Störmer M, Scholze F, Siewert F, van de Kruijs RWE, Milov I, Louis E, Jacyna I, Jurek M, Klinger D, Nittler L, Syryanyy Y, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H. Makhotkin IA, et al. Among authors: saksl k. J Synchrotron Radiat. 2018 Jan 1;25(Pt 1):77-84. doi: 10.1107/S1600577517017362. Epub 2018 Jan 1. J Synchrotron Radiat. 2018. PMID: 29271755 Free PMC article.
Characterization of megahertz X-ray laser beams by multishot desorption imprints in PMMA.
Vozda V, Burian T, Hájková V, Juha L, Enkisch H, Faatz B, Hermann M, Jacyna I, Jurek M, Keitel B, Klinger D, Loch R, Louis E, Makhotkin IA, Plönjes E, Saksl K, Siewert F, Sobierajski R, Strobel S, Tiedtke K, Toleikis S, de Vries G, Zelinger Z, Chalupský J. Vozda V, et al. Among authors: saksl k. Opt Express. 2020 Aug 31;28(18):25664-25681. doi: 10.1364/OE.396755. Opt Express. 2020. PMID: 32906853 Free article.
Investigating the interaction of x-ray free electron laser radiation with grating structure.
Gaudin J, Ozkan C, Chalupský J, Bajt S, Burian T, Vyšín L, Coppola N, Farahani SD, Chapman HN, Galasso G, Hájková V, Harmand M, Juha L, Jurek M, Loch RA, Möller S, Nagasono M, Störmer M, Sinn H, Saksl K, Sobierajski R, Schulz J, Sovak P, Toleikis S, Tiedtke K, Tschentscher T, Krzywinski J. Gaudin J, et al. Among authors: saksl k. Opt Lett. 2012 Aug 1;37(15):3033-5. doi: 10.1364/OL.37.003033. Opt Lett. 2012. PMID: 22859076
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.
Nelson AJ, Toleikis S, Chapman H, Bajt S, Krzywinski J, Chalupsky J, Juha L, Cihelka J, Hajkova V, Vysin L, Burian T, Kozlova M, Fäustlin RR, Nagler B, Vinko SM, Whitcher T, Dzelzainis T, Renner O, Saksl K, Khorsand AR, Heimann PA, Sobierajski R, Klinger D, Jurek M, Pelka J, Iwan B, Andreasson J, Timneanu N, Fajardo M, Wark JS, Riley D, Tschentscher T, Hajdu J, Lee RW. Nelson AJ, et al. Among authors: saksl k. Opt Express. 2009 Sep 28;17(20):18271-8. doi: 10.1364/OE.17.018271. Opt Express. 2009. PMID: 19907618 Free article.
How metallic Fe controls the composition of its native oxide.
Couet S, Schlage K, Saksl K, Röhlsberger R. Couet S, et al. Among authors: saksl k. Phys Rev Lett. 2008 Aug 1;101(5):056101. doi: 10.1103/PhysRevLett.101.056101. Epub 2008 Aug 1. Phys Rev Lett. 2008. PMID: 18764408
Atomic structure of Al(89)La(6)Ni(5) metallic glass.
Saksl K, Jóvári P, Franz H, Zeng QS, Liu JF, Jiang JZ. Saksl K, et al. J Phys Condens Matter. 2006 Aug 16;18(32):7579-92. doi: 10.1088/0953-8984/18/32/007. Epub 2006 Jul 25. J Phys Condens Matter. 2006. PMID: 21690871
17 results