Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.
Nelson AJ, Toleikis S, Chapman H, Bajt S, Krzywinski J, Chalupsky J, Juha L, Cihelka J, Hajkova V, Vysin L, Burian T, Kozlova M, Fäustlin RR, Nagler B, Vinko SM, Whitcher T, Dzelzainis T, Renner O, Saksl K, Khorsand AR, Heimann PA, Sobierajski R, Klinger D, Jurek M, Pelka J, Iwan B, Andreasson J, Timneanu N, Fajardo M, Wark JS, Riley D, Tschentscher T, Hajdu J, Lee RW.
Nelson AJ, et al. Among authors: saksl k.
Opt Express. 2009 Sep 28;17(20):18271-8. doi: 10.1364/OE.17.018271.
Opt Express. 2009.
PMID: 19907618
Free article.