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Combined Effect of TID Radiation and Electrical Stress on NMOSFETs.
Cao Y, Wang M, Zheng X, Zhang E, Lv L, Wang L, Ma M, Lv H, Wang Z, Wang Y, Tian W, Ma X, Hao Y. Cao Y, et al. Among authors: wang l, wang z, wang y, wang m. Micromachines (Basel). 2022 Oct 29;13(11):1860. doi: 10.3390/mi13111860. Micromachines (Basel). 2022. PMID: 36363882 Free PMC article.
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