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Estimating Step Heights from Top-Down SEM Images.
Arat KT, Bolten J, Zonnevylle AC, Kruit P, Hagen CW. Arat KT, et al. Among authors: kruit p. Microsc Microanal. 2019 Aug;25(4):903-911. doi: 10.1017/S143192761900062X. Epub 2019 May 21. Microsc Microanal. 2019. PMID: 31109392
Low-energy foil aberration corrector.
van Aken RH, Hagen CW, Barth JE, Kruit P. van Aken RH, et al. Among authors: kruit p. Ultramicroscopy. 2002 Dec;93(3-4):321-30. doi: 10.1016/s0304-3991(02)00287-5. Ultramicroscopy. 2002. PMID: 12492241
Resolution limit for EBID on thick substrates.
Hagen CW, Silvis-Cividjian N, Kruit P. Hagen CW, et al. Among authors: kruit p. Scanning. 2005 May-Jun;27(3):159. Scanning. 2005. PMID: 15934510 No abstract available.
Design of an aberration corrected low-voltage SEM.
van Aken RH, Maas DJ, Hagen CW, Barth JE, Kruit P. van Aken RH, et al. Among authors: kruit p. Ultramicroscopy. 2010 Oct;110(11):1411-9. doi: 10.1016/j.ultramic.2010.07.012. Epub 2010 Aug 4. Ultramicroscopy. 2010. PMID: 20728276
Simulation of ion imaging: sputtering, contrast, noise.
Castaldo V, Hagen CW, Kruit P. Castaldo V, et al. Among authors: kruit p. Ultramicroscopy. 2011 Jul;111(8):982-94. doi: 10.1016/j.ultramic.2011.03.019. Epub 2011 Apr 6. Ultramicroscopy. 2011. PMID: 21740861
77 results