Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors.
Chen HC, Chang TC, Lai WC, Chen GF, Chen BW, Hung YJ, Chang KJ, Cheng KC, Huang CS, Chen KK, Lu HH, Lin YH.
Chen HC, et al. Among authors: chen kk, chen gf, chen bw.
ACS Appl Mater Interfaces. 2018 Aug 8;10(31):25866-25870. doi: 10.1021/acsami.7b16307. Epub 2018 Feb 26.
ACS Appl Mater Interfaces. 2018.
PMID: 29481039