Long-Term Degradation Mechanisms in Application-Implemented Radical Thin Films.
Nowik-Boltyk EM, Junghoefer T, Glaser M, Giangrisostomi E, Ovsyannikov R, Zhang S, Shu C, Rajca A, Calzolari A, Casu MB.
Nowik-Boltyk EM, et al. Among authors: casu mb.
ACS Appl Mater Interfaces. 2023 Jun 28;15(25):30935-30943. doi: 10.1021/acsami.3c02057. Epub 2023 Jun 15.
ACS Appl Mater Interfaces. 2023.
PMID: 37319383
Free PMC article.