Ptychographic X-ray speckle tracking with multi-layer Laue lens systems.
Morgan AJ, Murray KT, Prasciolu M, Fleckenstein H, Yefanov O, Villanueva-Perez P, Mariani V, Domaracky M, Kuhn M, Aplin S, Mohacsi I, Messerschmidt M, Stachnik K, Du Y, Burkhart A, Meents A, Nazaretski E, Yan H, Huang X, Chu YS, Chapman HN, Bajt S.
Morgan AJ, et al. Among authors: huang x.
J Appl Crystallogr. 2020 Jul 8;53(Pt 4):927-936. doi: 10.1107/S1600576720006925. eCollection 2020 Aug 1.
J Appl Crystallogr. 2020.
PMID: 32788900
Free PMC article.