Khouchaf L - Search Results

1

Study of the Microstructure of Amorphous Silica Nanostructures Using High-Resolution Electron Microscopy, Electron Energy Loss Spectroscopy, X-ray Powder Diffraction, and Electron Pair Distribution Function.

Khouchaf L, Boulahya K, Das PP, Nicolopoulos S, Kis VK, Lábár JL. Khouchaf L, et al. Materials (Basel). 2020 Oct 1;13(19):4393. doi: 10.3390/ma13194393. Materials (Basel). 2020. PMID: 33019776 Free PMC article.

2

Evidence of depolymerisation of amorphous silica at medium- and short-range order: XANES, NMR and CP-SEM contributions.

Khouchaf L, Hamoudi A, Cordier P. Khouchaf L, et al. J Hazard Mater. 2009 Sep 15;168(2-3):1188-91. doi: 10.1016/j.jhazmat.2009.02.164. Epub 2009 Mar 13. J Hazard Mater. 2009. PMID: 19356848

3

Conductive Polymer Composites for Hydrogen Sulphide Sensors Working at Sub-PPM Level and Room Temperature.

Duc C, Boukhenane ML, Fagniez T, Khouchaf L, Redon N, Wojkiewicz JL. Duc C, et al. Among authors: khouchaf l. Sensors (Basel). 2021 Sep 30;21(19):6529. doi: 10.3390/s21196529. Sensors (Basel). 2021. PMID: 34640849 Free PMC article.

4

Interfacial energy-dispersive spectroscopy profile X-ray resolution measurements in variable pressure SEM.

Zoukel A, Khouchaf L, Di Martino J, Ruch D. Zoukel A, et al. Among authors: khouchaf l. Microsc Microanal. 2014 Oct;20(5):1565-75. doi: 10.1017/S1431927614001676. Epub 2014 Jun 24. Microsc Microanal. 2014. PMID: 24960537

5

A new approach to reach the best resolution of X-ray microanalysis in the variable pressure SEM.

Zoukel A, Khouchaf L, Arnoult C, Di Martino J, Ruch D. Zoukel A, et al. Among authors: khouchaf l. Micron. 2013 Mar;46:12-21. doi: 10.1016/j.micron.2012.11.003. Epub 2012 Nov 23. Micron. 2013. PMID: 23290709

6

Skirting effects in the variable pressure scanning electron microscope: limitations and improvements.

Zoukel A, Khouchaf L, Di Martino J, Ruch D. Zoukel A, et al. Among authors: khouchaf l. Micron. 2013 Jan;44:107-14. doi: 10.1016/j.micron.2012.05.004. Epub 2012 May 30. Micron. 2013. PMID: 22682956

7

The secondary X-ray fluorescence and absorption near the interface of multi-material: case of EDS microanalysis.

Zoukel A, Khouchaf L. Zoukel A, et al. Among authors: khouchaf l. Micron. 2014 Dec;67:81-89. doi: 10.1016/j.micron.2014.06.009. Epub 2014 Jul 1. Micron. 2014. PMID: 25086233

8

Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy.

Hafsi Z, Mansour O, Kadoun A, Khouchaf L, Mathieu C. Hafsi Z, et al. Among authors: khouchaf l. Ultramicroscopy. 2018 Jan;184(Pt A):17-23. doi: 10.1016/j.ultramic.2017.08.002. Epub 2017 Aug 12. Ultramicroscopy. 2018. PMID: 28837892

9

Environmental gas impact on the emission volume of X-rays near the interface in the variable pressure scanning electron microscopy.

Mansour O, Lateb N, Zoukel A, Hafsi Z, Kadoun A, Khouchaf L. Mansour O, et al. Among authors: khouchaf l. Ultramicroscopy. 2020 Mar;210:112920. doi: 10.1016/j.ultramic.2019.112920. Epub 2019 Dec 14. Ultramicroscopy. 2020. PMID: 31869740

10

Pressure and scattering regime influence on the EDS profile resolution at a composite interface in environmental SEM.

Arnoult C, Di Martino J, Khouchaf L, Toniazzo V, Ruch D. Arnoult C, et al. Among authors: khouchaf l. Micron. 2011 Dec;42(8):877-83. doi: 10.1016/j.micron.2011.06.004. Epub 2011 Jun 15. Micron. 2011. PMID: 21723736

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