An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser.
Assalauova D, Kim YY, Bobkov S, Khubbutdinov R, Rose M, Alvarez R, Andreasson J, Balaur E, Contreras A, DeMirci H, Gelisio L, Hajdu J, Hunter MS, Kurta RP, Li H, McFadden M, Nazari R, Schwander P, Teslyuk A, Walter P, Xavier PL, Yoon CH, Zaare S, Ilyin VA, Kirian RA, Hogue BG, Aquila A, Vartanyants IA.
Assalauova D, et al. Among authors: kim yy.
IUCrJ. 2020 Oct 15;7(Pt 6):1102-1113. doi: 10.1107/S2052252520012798. eCollection 2020 Nov 1.
IUCrJ. 2020.
PMID: 33209321
Free PMC article.