Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs.
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Panarella L, et al. Among authors: kar gs.
ACS Appl Mater Interfaces. 2024 Nov 13;16(45):62314-62325. doi: 10.1021/acsami.4c10888. Epub 2024 Oct 28.
ACS Appl Mater Interfaces. 2024.
PMID: 39465649