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Unmasking the Resolution-Throughput Tradespace of Focused-Ion-Beam Machining.
Madison AC, Villarrubia JS, Liao KT, Copeland CR, Schumacher J, Siebein K, Ilic BR, Liddle JA, Stavis SM. Madison AC, et al. Among authors: stavis sm. Adv Funct Mater. 2022 Sep;32(38):10.1002/adfm.202111840. doi: 10.1002/adfm.202111840. Adv Funct Mater. 2022. PMID: 36824209 Free PMC article.
Rapid Prototyping of Nanofluidic Slits in a Silicone Bilayer.
Kole TP, Liao KT, Schiffels D, Ilic BR, Strychalski EA, Kralj JG, Liddle JA, Dritschilo A, Stavis SM. Kole TP, et al. Among authors: stavis sm. J Res Natl Inst Stand Technol. 2015 Nov 17;120:252-69. doi: 10.6028/jres.120.015. eCollection 2015. J Res Natl Inst Stand Technol. 2015. PMID: 26958449 Free PMC article.
Subnanometer localization accuracy in widefield optical microscopy.
Copeland CR, Geist J, McGray CD, Aksyuk VA, Liddle JA, Ilic BR, Stavis SM. Copeland CR, et al. Among authors: stavis sm. Light Sci Appl. 2018 Jul 11;7:31. doi: 10.1038/s41377-018-0031-z. eCollection 2018. Light Sci Appl. 2018. PMID: 30839614 Free PMC article.
31 results