An infrastructure for accurate characterization of single-event transients in digital circuits.
Savulimedu Veeravalli V, Polzer T, Schmid U, Steininger A, Hofbauer M, Schweiger K, Dietrich H, Schneider-Hornstein K, Zimmermann H, Voss KO, Merk B, Hajek M.
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Microprocess Microsyst. 2013.
PMID: 24748694
Free PMC article.