Nolze G - Search Results

1

Mapping of lattice distortion in martensitic steel-Comparison of different evaluation methods of EBSD patterns.

Cios G, Winkelmann A, Nolze G, Tokarski T, Rychłowski Ł, Dan L, Bała P. Cios G, et al. Among authors: nolze g. Ultramicroscopy. 2023 Nov;253:113824. doi: 10.1016/j.ultramic.2023.113824. Epub 2023 Aug 3. Ultramicroscopy. 2023. PMID: 37572392

2

Image distortions in SEM and their influences on EBSD measurements.

Nolze G. Nolze G. Ultramicroscopy. 2007 Feb-Mar;107(2-3):172-83. doi: 10.1016/j.ultramic.2006.07.003. Epub 2006 Aug 7. Ultramicroscopy. 2007. PMID: 17014961

3

Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon.

Winkelmann A, Nolze G. Winkelmann A, et al. Among authors: nolze g. Ultramicroscopy. 2010 Feb;110(3):190-4. doi: 10.1016/j.ultramic.2009.11.008. Epub 2009 Nov 24. Ultramicroscopy. 2010. PMID: 20005045

4

Chirality determination of quartz crystals using electron backscatter diffraction.

Winkelmann A, Nolze G. Winkelmann A, et al. Among authors: nolze g. Ultramicroscopy. 2015 Feb;149:58-63. doi: 10.1016/j.ultramic.2014.11.013. Epub 2014 Nov 20. Ultramicroscopy. 2015. PMID: 25436930

5

Element-specific Kikuchi patterns of Rutile.

Vos M, Winkelmann A, Nolze G. Vos M, et al. Among authors: nolze g. Ultramicroscopy. 2015 Sep;156:50-8. doi: 10.1016/j.ultramic.2015.04.018. Epub 2015 Apr 28. Ultramicroscopy. 2015. PMID: 25980954

6

Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction.

Nolze G, Winkelmann A, Boyle AP. Nolze G, et al. Ultramicroscopy. 2016 Jan;160:146-154. doi: 10.1016/j.ultramic.2015.10.010. Epub 2015 Oct 23. Ultramicroscopy. 2016. PMID: 26517547 Free article.

7

Direct Atom Imaging by Chemical-Sensitive Holography.

Lühr T, Winkelmann A, Nolze G, Krull D, Westphal C. Lühr T, et al. Among authors: nolze g. Nano Lett. 2016 May 11;16(5):3195-201. doi: 10.1021/acs.nanolett.6b00524. Epub 2016 Apr 21. Nano Lett. 2016. PMID: 27070050

8

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications.

Winkelmann A, Nolze G, Vespucci S, Naresh-Kumar G, Trager-Cowan C, Vilalta-Clemente A, Wilkinson AJ, Vos M. Winkelmann A, et al. Among authors: nolze g. J Microsc. 2017 Sep;267(3):330-346. doi: 10.1111/jmi.12571. Epub 2017 May 5. J Microsc. 2017. PMID: 28474742 Free article.

9

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction.

Naresh-Kumar G, Vilalta-Clemente A, Jussila H, Winkelmann A, Nolze G, Vespucci S, Nagarajan S, Wilkinson AJ, Trager-Cowan C. Naresh-Kumar G, et al. Among authors: nolze g. Sci Rep. 2017 Sep 7;7(1):10916. doi: 10.1038/s41598-017-11187-z. Sci Rep. 2017. PMID: 28883500 Free PMC article.

10

Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns.

Nolze G, Tokarski T, Cios G, Winkelmann A. Nolze G, et al. J Appl Crystallogr. 2020 Mar 25;53(Pt 2):435-443. doi: 10.1107/S1600576720000692. eCollection 2020 Apr 1. J Appl Crystallogr. 2020. PMID: 32280320 Free PMC article.

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