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Novel technology for controlled fabrication of aperture cantilever sensors for scanning near-field optical microscopy.
Micron. 2024 Apr;179:103610. doi: 10.1016/j.micron.2024.103610. Epub 2024 Feb 14.
Micron. 2024.
PMID: 38367292
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures.
Kolomiytsev AS, Gromov AL, Il'in OI, Panchenko IV, Kotosonova AV, Ballouk A, Rodriguez D, Ageev OA.
Kolomiytsev AS, et al. Among authors: kotosonova av.
Ultramicroscopy. 2022 Apr;234:113481. doi: 10.1016/j.ultramic.2022.113481. Epub 2022 Jan 31.
Ultramicroscopy. 2022.
PMID: 35152156
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