A machine learning framework to adjust for learning effects in medical device safety evaluation.
Koola JD, Ramesh K, Mao J, Ahn M, Davis SE, Govindarajulu U, Perkins AM, Westerman D, Ssemaganda H, Speroff T, Ohno-Machado L, Ramsay CR, Sedrakyan A, Resnic FS, Matheny ME.
Koola JD, et al. Among authors: westerman d.
J Am Med Inform Assoc. 2025 Jan 1;32(1):206-217. doi: 10.1093/jamia/ocae273.
J Am Med Inform Assoc. 2025.
PMID: 39471493